Get Input Data (TSM)

Get Input Data (TSM)

Requires: TSM

Returns per-site input data as defined in the Semiconductor Multi Test step. You must manually select the polymorphic instance you want to use.

Double

Returns per-site double-precision, floating-point data as defined in the Semiconductor Multi Test step.

	Semiconductor Module Context is a valid ActiveX reference to a Semiconductor Module context object.
	Pin specifies the name of the pin associated with the Data Out parameter. This parameter must match the values you specify on the Per-Site Inputs tab of the Semiconductor Multi Test step.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Input Data Id is the unique ID to distinguish the data. This parameter must match the values you specify on the Per-Site Inputs tab of the Semiconductor Multi Test step.
	Semiconductor Module Context Out returns the Semiconductor Module Context parameter unchanged.
	Data Out returns the per-site double-precision, floating-point data associated with the Data Source column for the row with a matching pin and Input Data Id parameter values in the Per-Site Inputs table on the Per-Site Inputs tab of the Semiconductor Multi Test step.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

Boolean

Returns per-site Boolean data as defined in the Semiconductor Multi Test step.

	Semiconductor Module Context is a valid ActiveX reference to a Semiconductor Module context object.
	Pin specifies the name of the pin associated with the Data Out parameter. This parameter must match the values you specify on the Per-Site Inputs tab of the Semiconductor Multi Test step.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Input Data Id is the unique ID to distinguish the data. This parameter must match the values you specify on the Per-Site Inputs tab of the Semiconductor Multi Test step.
	Semiconductor Module Context Out returns the Semiconductor Module Context parameter unchanged.
	Data Out returns the per-site Boolean data associated with the Data Source column for the row with a matching pin and Input Data Id parameter values in the Per-Site Inputs table on the Per-Site Inputs tab of the Semiconductor Multi Test step.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.

String

Returns per-site string data as defined in the Semiconductor Multi Test step.

	Semiconductor Module Context is a valid ActiveX reference to a Semiconductor Module context object.
	Pin specifies the name of the pin associated with the Data Out parameter. This parameter must match the values you specify on the Per-Site Inputs tab of the Semiconductor Multi Test step.
	error in (no error) describes error conditions that occur before this VI or function runs. The default is no error. If an error occurred before this VI or function runs, the VI or function passes the error in value to error out. This VI or function runs normally only if no error occurred before this VI or function runs. If an error occurs while this VI or function runs, it runs normally and sets its own error status in error out.
	Input Data Id is the unique ID to distinguish the data. This parameter must match the values you specify on the Per-Site Inputs tab of the Semiconductor Multi Test step.
	Semiconductor Module Context Out returns the Semiconductor Module Context parameter unchanged.
	Data Out returns the per-site string data associated with the Data Source column for the row with matching the pin and Input Data Id parameter values in the Per-Site Inputs table on the Per-Site Inputs tab of the Semiconductor Multi Test step.
	error out contains error information. If error in indicates that an error occurred before this VI or function ran, error out contains the same error information. Otherwise, it describes the error status that this VI or function produces. Right-click the error out front panel indicator and select Explain Error from the shortcut menu for more information about the error.