The PXIe-4133 provides the measurement functions necessary for testing of diodes, specifically targeting laser diodes and VCSEL diodes. The PXIe-4133 provides fast current pulsing (2.5 µs minimum pulse width) and voltage measurement for forward bias testing, and supports triggers for synchronization with external measurements, such as photodiode tests for LIV sweeps. The PXIe-4133 also supports current leakage measurements (reverse voltage) and voltage breakdown measurements (reverse current).

The PXIe-4133 produces pulses that rise and settle quickly for up to 10 m cable lengths and, unlike typical SMU devices, it does not require tuning for specific loads or cables. Each channel uses two triaxial cables to connect to a device under test (DUT). One cable carries the pulse current and return (Force HI and Force LO), which the other cable provides a remote sense of the voltage on the DUT.