This document contains the TestStand Semiconductor Module Bug Fixes
that were discovered before and since the release of
NI TestStand 2016 SP1 Semiconductor Module. Not every bug fix known to NI will appear on this
list; it is intended to only show the severe and more common issues
that have been addressed.
Feel free to contact NI regarding this document or issues in the document. If you are contacting NI in regards to a specific issue, be sure to reference the ID number given in the document to the NI representative. The ID number contains the current issue ID number as well as the legacy ID number (use the current ID number when contacting National Instruments). You can contact us through any of the normal support channels including phone, email, or the discussion forums. Visit the NI Website to contact us.
The following items are Bug Fixes in NI TestStand 2016 SP1 Semiconductor Module.
| ID | Fixed Issue | Issue Details |
|---|---|---|
| 557654 | Importing limits from a test limits file that changes the evaluation type of a test might not correctly set the flags on the test properties | If you import test limits into a sequence file with the Update limits in matching tests option enabled and the import operation changes the Evaluation Type of an existing test, certain flags on the test properties are set incorrectly. These flags do not affect execution of the test program because the Semiconductor Multi Test step corrects the settings at run time. The specific flag involved is the Dont Copy To Results flag on the NumericLimit or PassFail properties. |
| 590475 | You must restart the computer to install the TestStand Semiconductor Module after you install TestStand, which prevents silent installs |
The TestStand Semiconductor Module relies on a reboot of the computer after you install TestStand. If you do not restart the computer, a modal dialog box returns the following error: |
| 596546 | Cycle and socket times might temporarily increase after you click inside the Bin Summary Table of the LabVIEW operator interface while executing a lot | Clicking inside the Bin Summary Table of the TestStand Semiconductor Module LabVIEW operator interface while executing a lot might result in temporarily increased cycle and socket times. The overall performance degradation is more pronounced with higher site counts. |
| 598494 | Some legacy digital example LabVIEW VIs are not saved in the correct version of LabVIEW | The following VIs are saved in LabVIEW 2014 instead of in LabVIEW 2013:
|
| 600508 | The TestStand Semiconductor Module fails to call the LabVIEW event callback for the ErrorOccurred event | LabVIEW operator interfaces can use the SemiconductorModuleManager object to register an event callback for the ErrorOccurred event. Although the Semiconductor Module should call the event callback when a run-time error occurs during testing, it fails to do so. Even if the error event is not properly raised, parts are correctly binned to the default error bin as defined by in the bin definitions file. |
| 605735 | Disabling result recording returns an error | When you set the option in the Station Options dialog box to disable result recording for all sequences, you might receive an "Object reference not set to an instance of an object" error message. |
| 608349 | Test Results Log and STDF log contain duplicate test results for steps that use looping in TestStand | For a step in TestStand that loops N times, N+1 results are generated. The Test Results Log and STDF result processors treat the 0th and Nth result the same and duplicate the information in the log files. |
| 608675 | Incorrect configuration definition causes Error -17101 | If you define test condition but do not define a test configuration, the Lot Settings dialog box returns an error when it attempts to load the current value of the test conditions to populate the corresponding fields in the dialog box. |
| 613643 | Pin map does not support correctly specifying RFPM port number range | The RF subsystem definition assumes continuous range of ports. It is not possible to limit the range of supported ports appropriately in the pin map for an RF subsystem. The hardware does not physically support the options available in the 'Connections' section of the pin map. |
| 626657 | Set Site Data VI incorrectly stores site data when called from a code module that executes on all sites and the site numbers are not in numeric order | If a code module executes on all sites because the subsystem includes all sites or because the "One thread only" setting is enabled and the sites in the Semiconductor Module context are not in numerical order, the Set Site Data VI stores the site data incorrectly. |
| 627973 | Running TestStand Version Selector improperly registers 32-bit TestStand Semiconductor Module (TSM) type libraries | Running the TestStand Version Selector to make TestStand 2016 active when 32-bit TSM 2016 is installed improperly registers 32-bit TestStand Semiconductor Module (TSM) type libraries, and the type libraries no longer include references to the TestStand type libraries. This situation causes various TestStand types used in the TSM Application API to change from SequenceFile Object References to Object References, which result in broken VIs in the TSM operator interfaces because the associated references turned into variants in LabVIEW. |
| 634125 | Exporting limits for a Pass/Fail test exports the value "LOG&qout for the Comparison Type column | The Comparison Type column is not used for Pass/Fail tests and should export a blank value. |
| 641153 | Undo/redo on Options tab changes focus to the Properties tab for Step Settings | If you undo or redo a change on the Options tab of the Step Settings of a step, the focus switches back to the Properties tab. |
| 643064 | Importing Test Limits from a File tutorial reports a run-time error | The sequence file for the Importing Test Limits from a File tutorial reports a run-time error because the pin map uses NI-HSDIO instruments instead of NI-Digital instruments. |