This document contains the TestStand Semiconductor Module Bug Fixes
that were discovered before and since the release of
TestStand 2016 Semiconductor Module. Not every bug fix known to NI will appear on this
list; it is intended to only show the severe and more common issues
that have been addressed.
Feel free to contact NI regarding this document or issues in the document. If you are contacting NI in regards to a specific issue, be sure to reference the ID number given in the document to the NI representative. The ID number contains the current issue ID number as well as the legacy ID number (use the current ID number when contacting National Instruments). You can contact us through any of the normal support channels including phone, email, or the discussion forums. Visit the NI Website to contact us.
The following items are Bug Fixes in TestStand 2016 Semiconductor Module.
| ID | Legacy ID | Fixed Issue | Issue Details |
|---|---|---|---|
| 526084 |
| Uninstalling one bitness of TestStand Semiconductor Module removes the license for the remaining bitness | If the 32-bit and 64-bit TestStand Semiconductor Module are installed and you uninstall one of the two versions, the NI License Manager no longer recognizes the remaining TestStand Semiconductor Module version. |
| 529409 |
| Configure Station Settings and Configure Lot Settings dialog boxes might become unresponsive when you run the operator interface in LabVIEW development environment | When you run the TestStand Semiconductor Module operator interface in the LabVIEW development environment, the Configure Station Settings and the Configure Lot Settings dialog boxes might become unresponsive if you previously ran and exited the operator interface at least once. |
| 561325 |
| TestStand might report that references to PropertyObjects were not released properly when you exit the LabVIEW operator interface while running in LabVIEW development environment | If you run the TestStand Semiconductor Module LabVIEW operator interface in the LabVIEW development environment, when you exit the operator interface, TestStand might launch a dialog box warning that nine top-level references to PropertyObjects were not released properly. This warning occurs only when at least one of the Semiconductor Module result processors is enabled and only when running within the LabVIEW development environment. You can safely ignore this warning message. |
| 564895 |
| Default operator interfaces do not disable tracing, which can negatively affect performance | The default operator interfaces do not disable tracing for executions. Tracing can be useful when executing in the sequence editor but provides no benefit when executing in an operator interface. Tracing can negatively affect performance. |
| 569151 |
| The TestStand Sequence Editor might require two attempts to close after you open the Lot Statistics Viewer | After you launch the Lot Statistics Viewer from the TestStand Sequence Editor, you might need to make two attempts to completely close the sequence editor. |
| 573157 |
| The Pin Map Editor incorrectly displays the De-embedding File path control for connections for which the file does not apply | The Pin Map Editor incorrectly displays the De-embedding File path control for connections for all instrument types. |
| 575844 |
| Shipping LabVIEW code module examples might not report the first error that occurs during execution | The shipping LabVIEW code module examples do not pass error wires after For Loops in the correct order. If an error occurs before the For Loop executes and another error occurs inside the For Loop, the Merge Errors function returns the error that occurred inside the For Loop. |
| 576250 |
| Tests Results Log report does not honor the test numeric display format for test evaluations | The TestStand Semiconductor Module Multi Test step type supports setting a numeric format for all tests in a step. However, the Test Results Log report does not reflect the numeric format you specify for the data and limits of each test evaluation. |
| 578015 |
| Setting an Instrument value in the Connections table of the Pin Map Editor modifies two connections when you sort items by the Instrument column | When you use the Instrument column to sort items in the Connections table of the Pin Map Editor, changes you make to the Instrument value of an item modify two connections instead of only the connection you are editing. |
| 578053 |
| Error -17328 occurs when you execute a lot after disabling the TestStand Semiconductor Module after uninstalling and reinstalling | If you use the Disable/Enable Semiconductor Module menu item to disable the TestStand Semiconductor Module, uninstall the Semiconductor Module, and then reinstall the Semiconductor Module, the Semiconductor Module type palettes are not loaded, which results in error '-17328; Unknown or missing type' when you execute a lot. |
| 581512 |
| You cannot view or edit HSDIO instrument PFI lines in the Pin Map Editor | When you add an HSDIO instrument in the Pin Map Editor, you cannot select the PFI lines for the instrument in the Channel column of the Connections node. You must manually edit the pin map XML file directly to add PFI lines. After you edit the Pin Map XML file, the PFI line connection does not appear in the Channel column of the Pin Map Editor. |
| 584218 |
| Exporting and importing test limits loads limits only for TestStand Semiconductor Module Multi Test steps | If you create a custom step type based on the TestStand Semiconductor Module Multi Test step type, you cannot load limits for instances of the custom step type. |
| 588793 |
| The Units/Hour indicator on the default TestStand Semiconductor Module operator interface might not show the correct throughput of the tester | The units/hour calculation uses the number of configured sites, not the currently active sites. |
| 598494 |
| Some legacy digital example LabVIEW VIs are not saved in the correct version of LabVIEW |
The following VIs are saved in LabVIEW 2014 instead of in LabVIEW 2013:
This issue is fixed in the TestStand 2016 Semiconductor Module f1 patch. |
| 600508 |
| The TestStand Semiconductor Module fails to call the LabVIEW event callback for the ErrorOccurred event |
LabVIEW operator interfaces can use the SemiconductorModuleManager object to register an event callback for the ErrorOccurred event. Although the Semiconductor Module should call the event callback when a run-time error occurs during testing, it fails to do so. This issue is fixed in the TestStand 2016 Semiconductor Module f1 patch. |
| 611229 |
| An error dialog box appears if you view the Per-Site Inputs tab of a Semiconductor Action step followed by a Semiconductor Multi Test step or vice versa |
When you launch TestStand or if you deleted the GeneralEngine.cfg file in <ProgramData>, TestStand returns the following error if you click the Semiconductor Action step or the Semiconductor Multi Test step in either order: This issue is fixed in the TestStand 2016 Semiconductor Module f1 patch. |