Semiconductor device geometries are shrinking and becoming more complex, while major technology trends such as autonomous vehicles are placing additional pressure on the semiconductor supply chain to provide higher assurances of product quality. In order to keep up with these challenging demands and still release stable technology nodes ahead of the competition, semiconductor wafer-process engineers need more reliability-measurement data—and they need it faster than ever before.
A wafer-level reliability (WLR) solution must address these key requirements:
Shorter WLR test cycles—from months to days—with industry-leading parallelism and measurement speed
Configurable and upgradeable channel count in a highly flexible SMU-per-pin architecture
Perform JEDEC reliability tests quickly and simply with our WLR Test Soft Front Panel and APIs
Optional add-ons for remote systems management and data analytics
NI offers a variety of solution integration options customized to your application-specific requirements. You can use your own internal integration teams for full system control or leverage the expertise of NI and our worldwide NI Partner Network to obtain a turnkey solution.
NI works with customers throughout the life of an application, delivering training, technical support, consultation and integration services, and maintenance programs. Teams can discover new skills by participating in NI-specific and geographic user groups and build proficiency with online and in-person training.
Learn about NI's Semiconductor Wafer-Level Reliability Solution.
An NI Partner is a business entity independent from NI and has no agency or joint-venture relationship and does not form part of any business associations with NI.