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The Digital Pattern Editor includes tools like Schmoo plots to provide a deeper understanding of device-under-test (DUT) performance across variation. The editor also offers debugging tools such as overlaying pattern failures on a pattern or using digital scope for an analog view of the pin data.
Gain a deeper understanding of the PXI architecture and its real-world applications.
Learn about migrating existing PXI systems to take advantage of the features that the PXI Digital Pattern Instrument offers for ATE-class digital.
Discover how the STS delivers the openness and flexibility of the PXI platform to the semiconductor production environment.
Application Resource
Fundamentals of Building a Test System
Defining a test strategy and planning system investments are critical to reducing cost, optimizing your test-investment life cycle, and maximizing efficiency. Learn test strategies, best practices, and design tradeoffs for your test systems.
Explore a wide range of support content, including examples and troubleshooting information.