ISemiconductorModuleContext Interface
- Updated2026-06-25
- 24 minute(s) read
The Semiconductor Multi Test step creates an ISemiconductorModuleContext object that describes a subset of pins, relays, sites, and instruments on a test system for the instance of the multisite code module. Pass the Step.SemiconductorModuleContext property to the code module as an ISemiconductorModuleContext interface to write a test for multisite situations.
Derives from
None
Syntax
Namespace: NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI
public interface ISemiconductorModuleContext
Properties
| Name | Description |
|---|---|
| DigitalPatternProjectCaptureWaveformFilePaths | The absolute paths to the Capture Waveform files in the Digital Pattern Project associated with this Semiconductor Module Context. |
| DigitalPatternProjectLevelsFilePaths | The absolute paths to the Levels file in the Digital Pattern Project associated with this Semiconductor Module Context. |
| DigitalPatternProjectPatternFilePaths | The absolute paths to the Pattern files in the Digital Pattern Project associated with this Semiconductor Module Context. |
| DigitalPatternProjectSourceWaveformFilePaths | The absolute paths to the Source Waveform files in the Digital Pattern Project associated with this Semiconductor Module Context. |
| DigitalPatternProjectSpecificationsFilePaths | The absolute paths to the Specifications files in the Digital Pattern Project associated with this Semiconductor Module Context. |
| DigitalPatternProjectTimingFilePaths | The absolute paths to the Timing files in the Digital Pattern Project associated with this Semiconductor Module Context. |
| IsSemiconductorModuleInOfflineMode | Returns a Boolean that indicates whether the Semiconductor Module is currently in Offline Mode. |
| PinMapFilePath | The absolute path to the pin map file for this ISemiconductorModuleContext. |
| PinMapUsesNIDCPowerChannelGroups | Returns a Boolean that indicates whether the pin map used by the Semiconductor Module context has NI-DCPower instruments configured to use channel groups. Use this Boolean when writing a code module that may be used with legacy pin maps created before the introduction of NI-DCPower channel groups. |
| SiteNumbers | Returns the site numbers in the ISemiconductorModuleContext. The site numbers can be different each time a step executes because some sites might not be active. The site numbers are in numerical order. |
| TraceLogger | Returns the global TestStand Semiconductor Module logger. |
Methods
| Name | Description |
|---|---|
| ApplyRelayConfiguration(string, double) | Performs the relay actions on the relays in the relay configuration. |
| ApplyRelayConfiguration(string) | Performs the relay actions on the relays in the relay configuration. |
| ControlRelay(string[], RelayDriverAction[]) | Performs the relay actions on the relays. |
| ControlRelay(string[], RelayDriverAction, double) | Performs the relay action on the relays. |
| ControlRelay(string[], RelayDriverAction) | Performs the relay action on the relays. |
| ControlRelay(string[], RelayDriverAction[], double) | Performs the relay actions on the relays. |
| ControlRelay(string, RelayDriverAction, double) | Performs the relay action on the relays. |
| ControlRelay(string, RelayDriverAction) | Performs the relay action on the relay. |
| DisableAlarms(string[], string) | Disables the alarm(s) specified in the alarmNames parameter for the instruments connected to each pin or pin group specified in the pins parameter. If an instrument enters a state that would generate an alarm while the alarm is disabled, the alarm condition will be ignored. Once alarms are disabled with this method, they remain disabled until the instrument is reset, the lot completes, or the alarms are re-enabled using the EnableAlarms method. To re-enable the alarms, call the EnableAlarms method./> |
| EnableAlarms(string[], string) | Enables the alarm(s) specified in the alarmNames parameter for the instruments connected to each pin or pin group specified in thepins parameter. This method is typically used to re-enable alarms that have previously been disabled using the DisableAlarms method. For this method to enable alarms, alarms must also be enabled for the current test program in the Alarms panel of the Test Program Editor. This method enables alarms only if it is called the same number of times that the DisableAlarms method was called. |
| FilterPinsByInstrumentType(string[], string, string) | Filters pins by instrumentTypeId . Pass a list of all pins or pin groups to return the pins connected to instruments of the type you specify in the instrumentTypeId . If no pins are connected to instruments of the type you specify in instrumentTypeId , this method returns an empty array. The return value is an array subset of pin names in pins that are connected to an instrument of the filtered instrumentTypeId . |
| FilterPinsByInstrumentType(string[], string, Capability) | Filters pins by instrumentTypeId . Pass a list of all pins or pin groups to return the pins connected to instruments of the type you specify in the instrumentTypeId . If no pins are connected to instruments of the type you specify in instrumentTypeId , this method returns an empty array. The return value is an array subset of pin names in pins that are connected to an instrument of the filtered instrumentTypeId . |
| FilterRelaysByInstrumentType(string[], string) | Filters relays by instrumentTypeId . Pass a list of all relays or relay groups to return the relays connected to instruments of the type you specify in the instrumentTypeId . If no relays are connected to instruments of the type you specify in instrumentTypeId , this method returns an empty array. |
| GetAlarmBehavior(string, string) | Returns the behavior associated with an alarm on the pin on each site in the ISemiconductorModuleContext. Use the OverrideAlarmBehavior(string, string, AlarmBehavior) and RestoreAlarmBehavior(string, string) methods to change the behavior associated with an alarm on pins. |
| GetAllCustomSessions(string, out object[], out string[], out string[]) | Returns all set sessions in the ISemiconductorModuleContext that belong to instruments of type instrumentTypeId . |
| GetAllFpgaVIReferences() | Returns an array of all FPGA VI references in the ISemiconductorModuleContext. |
| GetAllNIDAQmxTasks(string) | Returns an array of all NI-DAQmx tasks in the ISemiconductorModuleContext whose task type matches taskType . You can use tasks to perform NI-DAQmx operations. |
| GetAllNIDCPowerSessions() | Returns all NI-DCPower instrument sessions in the ISemiconductorModuleContext. You can use instrument sessions to close driver sessions. |
| GetAllNIDigitalPatternSessions() | Returns all NI-Digital Pattern instrument sessions in the ISemiconductorModuleContext. You can use instrument sessions to close driver sessions. |
| GetAllNIDmmSessions() | Returns an array of all NI-DMM instrument sessions in the ISemiconductorModuleContext. You can use instrument sessions to close driver sessions. |
| GetAllNIFGenSessions() | Returns an array of all NI-FGEN instrument sessions in the ISemiconductorModuleContext. You can use instrument sessions to close driver sessions. |
| GetAllNIHsdioSessions(out IEnumerable< ulong >, out IEnumerable< ulong >) | Returns all NI-HSDIO acquisition sessions and all NI-HSDIO generation sessions in the ISemiconductorModuleContext. |
| GetAllNIRfmxSessions() | Returns an array of all NI-RFmx instrument sessions in the ISemiconductorModuleContext. You can use instrument sessions to close driver sessions. |
| GetAllNIRfpmDeembeddingData(out NIRfpm, out string, out string, out DeembeddingS2POrientation) | Returns an array of the NI-RFPM subsystem sessions and paths and orientations of the S2P files that characterize the de-embedding network for every port connected to a DUT pin in the Semiconductor Module context. |
| GetAllNIRfpmSessions() | Returns an array of all NI-RFPM subsystem sessions in the ISemiconductorModuleContext. You can use subsystem sessions to close driver sessions. |
| GetAllNIRfsaSessions() | Returns an array of all NI-RFSA instrument sessions in the ISemiconductorModuleContext. You can use instrument sessions to close driver sessions. |
| GetAllNIRfsgSessions() | Returns an array of all NI-RFSG instrument sessions in the ISemiconductorModuleContext. You can use instrument sessions to close driver sessions. |
| GetAllNIScopeSessions() | Returns an array of all NI-SCOPE instrument sessions in the ISemiconductorModuleContext. You can use instrument sessions to close driver sessions. |
| GetAllRelayDriverNISwitchSessions() | Returns an array of NI-SWITCH sessions for all relay driver modules in the ISemiconductorModuleContext. You can use the NI-SWITCH sessions to close the relay driver module sessions. |
| GetAllSwitchExecutiveSessions() | Returns an array of all switch executive sessions in the Semiconductor Module Context. |
| GetAllSwitchSessions(string) | Returns an array of all switch session data of the type specified by the multiplexerTypeId in the Semiconductor Module Context. |
| GetCustomInstrumentNames(string, out string[], out string[], out string[]) | Returns the channelGroupIds and associated instrumentNames and channelLists of all instruments of type instrumentTypeId defined in the ISemiconductorModuleContext. You can use instrumentNames , channelGroupIds , and channelLists to open driver sessions. The instrumentNames , channelGroupIds , and channelLists parameters always return the same number of elements. Instrument names repeat in instrumentNames if the instrument has multiple channel groups. |
| GetCustomSession(string, string[], out object, out string, out string) | Returns all sessions in the ISemiconductorModuleContext associated with pins . |
| GetCustomSession(string, string, out object, out string, out string) | Returns the session in the ISemiconductorModuleContext associated with pin . |
| GetCustomSessions(string, string, out object[], out string[], out string[]) | Returns all sessions in the ISemiconductorModuleContext associated with pin . |
| GetCustomSessions(string, string[], out object[], out string[], out string[]) | Returns all sessions in the ISemiconductorModuleContext associated with pins . |
| GetFpgaInstrumentNames(out string[]) | Returns the instrument names for all FPGA-enabled RF instruments in the ISemiconductorModuleContext. You can use the instrument names to open driver sessions. |
| GetFpgaVIReference(string) | Returns the FPGA VI reference of the instrument connected to the pin for all sites in the ISemiconductorModuleContext. If more than one instrument is connected to the pin, the method returns an error. |
| GetFpgaVIReferences(string) | Returns the FPGA VI references of the instruments connected to the pin for all sites in the ISemiconductorModuleContext. |
| GetGlobalData(string) | Returns a global data item that a previous call to the SetGlobalData method stores. Throws an exception if no data item with the specified dataId exists. Use the GlobalDataExists method to determine if the specified dataId exists. |
| GetGlobalData< T >(string) | Returns a global data item that a previous call to the SetGlobalData method stores. Casts the data item to the specified type T . Throws an exception if no data item with the specified dataId exists. Use the GlobalDataExists method to determine if the specified dataId exists. |
| GetInputDataAsBooleans(string, string) | Returns per-site Boolean data as defined in the Semiconductor Multi Test step. The return value is an array of the per-site Boolean data associated with the Data Source column for the row with a matching pin and inputDataId values of the Per-Site Inputs table on the Per-Site Inputs tab of the Semiconductor Multi Test step. |
| GetInputDataAsDoubles(string, string) | Returns per-site double-precision, floating-point data as defined in the Semiconductor Multi Test step. The return value is an array of the per-site double-precision, floating-point data associated with the Data Source column for the row with a matching pin and inputDataId values of the Per-Site Inputs table on the Per-Site Inputs tab of the Semiconductor Multi Test step. |
| GetInputDataAsStrings(string, string) | Returns per-site string data as defined in the Semiconductor Multi Test step. The return value is an array of the per-site string data associated with the Data Source column for the row with matching pin and inputDataId values of the Per-Site Inputs table on the Per-Site Inputs tab of the Semiconductor Multi Test step. |
| GetModelBasedInstruments(ModelBasedInstrumentSearchOptions) | Get the IModelBasedInstrument objects for all model-based instruments in the ISemiconductorModuleContext that match the specified instrumentSearchOptions . You can use IModelBasedInstrument objects to get the instrument properties for the information needed to create driver sessions. |
| GetModelBasedInstruments() | Get the IModelBasedInstrument objects for all model-based instruments in the ISemiconductorModuleContext. You can use IModelBasedInstrument objects to get the instrument properties for the information needed to create driver sessions. |
| GetNIDAQmxTask(string, out Task, out string) | Returns the NI-DAQmx task and channels list required to access the pin . If more than one task is required, the method throws an exception. |
| GetNIDAQmxTask(string[], out Task, out string) | Returns the NI-DAQmx task and available channels list required to access the pins . If more than one task is required, the method throws an exception. |
| GetNIDAQmxTaskNames(string, out string[]) | Returns an array of all NI-DAQmx task names and channel lists in the the ISemiconductorModuleContext. You can use the task names to create DAQmx tasks. |
| GetNIDAQmxTasks(string[], out Task[], out string[]) | Returns the NI-DAQmx tasks and available channels lists required to access the pins or pin groups. |
| GetNIDAQmxTasks(string) | This method is deprecated. Use GetAllNIDAQmxTasks instead. Returns all NI-DAQmx tasks in the ISemiconductorModuleContext. You can use tasks to close and dispose of tasks. |
| GetNIDAQmxTasks(string, out Task[], out string[]) | Returns the NI-DAQmx tasks and available channels lists required to access the pin or pin group. |
| GetNIDCPowerAlarmSession(NIDCPower) | Returns the alarm session associated with an NI-DCPower session. Returns 0 if there is not an alarm session associated with the specified NI-DCPower session. This method is intended for testing purposes only. |
| GetNIDCPowerInstrumentNames(out string[]) | Returns the channel IDs and instrument names associated with each NI-DCPower instrument channel in the ISemiconductorModuleContext. You can use instrument names and channel IDs to open driver sessions. The Get NI-DCPower Instrument Names method returns an instrument name and channel ID for each channel available in each NI-DCPower instrument. The returned instrument names and channelStrings parameter always return the same number of elements. Instrument names repeat if the instrument has multiple channels. |
| GetNIDCPowerResourceStrings() | Returns the resource strings associated with each channel group in the ISemiconductorModuleContext. A resource string is a comma-separated list of NI-DCPower resources, where each resource is defined by the <instrument>/<channel> associated with the NI-DCPower channel group. You can use the resource strings to open driver sessions. The same session controls all resources within the same resource string. This method supports only DC Power instruments defined with ChannelGroups in the pin map. |
| GetNIDCPowerSession(string, out NIDCPower, out string) | Returns the NI-DCPower session and channelString required to access the pin on all sites in the ISemiconductorModuleContext. If more than one session is required to access the pin , the method throws an exception. |
| GetNIDCPowerSession(string[], out NIDCPower, out string) | Returns the NI-DCPower session and channelString required to access the pins . If multiple sessions are required, the method throws an exception. |
| GetNIDCPowerSessions(string[], out NIDCPower[], out string[]) | Returns the NI-DCPower sessions and channelStrings required to access the pins . |
| GetNIDCPowerSessions(string, out NIDCPower[], out string[]) | Returns the NI-DCPower sessions and channelStrings required to access the pin . |
| GetNIDigitalPatternInstrumentNames() | Returns an array of instrument names and comma-separated lists of instrument names that belong to the same group for all NI-Digital Pattern instruments in the ISemiconductorModuleContext. You can use the instrument names and comma-separated lists of instrument names to open driver sessions. |
| GetNIDigitalPatternSession(string, out NIDigital, out string, out string) | Returns the NI-Digital Pattern session and pinSetString required to access the pin , as well as the siteList associated with the pinSetString . If more than one session is required to access the pin , the method throws an exception. Each group of NI-Digital Pattern instruments in the pin map creates a single instrument session. |
| GetNIDigitalPatternSession(string[], out NIDigital, out string, out string) | Returns the NI-Digital Pattern session and pinSetString required to access the pins , as well as the siteList associated with the pinSetString . If more than one session is required to access the pins , the method throws an exception. Each group of NI-Digital Pattern instruments in the pin map creates a single instrument session. |
| GetNIDigitalPatternSessionForPattern(string, out NIDigital, out string) | Returns the NI-Digital Pattern session and siteList required to perform pattern operations for patterns that use the pin . If more than one session is required to access the pin , the method throws an exception. Each group of NI-Digital Pattern instruments in the pin map creates a single instrument session. |
| GetNIDigitalPatternSessionForPattern(string[], out NIDigital, out string) | Returns the NI-Digital Pattern session and siteList required to perform pattern operations for patterns that use the pins . If more than one session is required to access the pins , the method throws an exception. Each group of NI-Digital Pattern instruments in the pin map creates a single instrument session. |
| GetNIDigitalPatternSessionForPpmu(string[], out NIDigital, out string) | Returns the NI-Digital Pattern session and pinSetString required to perform PPMU operations on pins . If more than one session is required to access the pins , the method throws an exception. Each group of NI-Digital Pattern instruments in the pin map creates a single instrument session. |
| GetNIDigitalPatternSessionForPpmu(string, out NIDigital, out string) | Returns the NI-Digital Pattern session and pinSetString required to perform PPMU operations on pin . If more than one session is required to access the pin , the method throws an exception. Each group of NI-Digital Pattern instruments in the pin map creates a single instrument session. |
| GetNIDigitalPatternSessions(string, out NIDigital[], out string[], out string[]) | Returns the NI-Digital Pattern sessions and pinSetStrings required to access the pin , as well as the siteLists associated with the pinSetStrings . |
| GetNIDigitalPatternSessions(string[], out NIDigital[], out string[], out string[]) | Returns the NI-Digital Pattern sessions and pinSetStrings required to access the pins , as well as the siteLists associated with the pinSetStrings . |
| GetNIDigitalPatternSessionsForPattern(string[], out NIDigital[], out string[]) | Returns the NI-Digital Pattern sessions and siteLists required to perform pattern operations for patterns that use the pins . |
| GetNIDigitalPatternSessionsForPattern(string, out NIDigital[], out string[]) | Returns the NI-Digital Pattern sessions and siteLists required to perform pattern operations for patterns that use the pin . |
| GetNIDigitalPatternSessionsForPpmu(string, out NIDigital[], out string[]) | Returns the NI-Digital Pattern sessions and pinSetStrings required to perform PPMU operations on pin . |
| GetNIDigitalPatternSessionsForPpmu(string[], out NIDigital[], out string[]) | Returns the NI-Digital Pattern sessions and pinSetStrings required to perform PPMU operations on pins . |
| GetNIDmmInstrumentNames() | Returns an array of all NI-DMM instrument names in the ISemiconductorModuleContext. You can use instrument names to open driver sessions. |
| GetNIDmmSession(string, out NIDmm) | Returns the NI-DMM session required to access the pin . If more than one session is required, the method throws an exception. |
| GetNIDmmSessions(string, out NIDmm[]) | Returns the NI-DMM sessions required to access the pin . |
| GetNIDmmSessions(string[], out NIDmm[]) | Returns the NI-DMM instrument sessions required to access the pins . |
| GetNIFGenInstrumentNames() | Returns an array of all NI-FGEN instrument names in the ISemiconductorModuleContext. You can use the instrument names to open driver sessions. |
| GetNIFGenSession(string[], out NIFgen, out string) | Returns the NI-FGEN session and channel list required to access the pins . If more than one session is required, the method throws an exception. |
| GetNIFGenSession(string, out NIFgen, out string) | Returns the NI-FGEN session and channel list required to access the pin . If more than one session is required, the method throws an exception. |
| GetNIFGenSessions(string, out NIFgen[], out string[]) | Returns the NI-FGEN sessions and channel lists required to access the pin . |
| GetNIFGenSessions(string[], out NIFgen[], out string[]) | Returns the NI-FGEN sessions and channel lists required to access the pins . |
| GetNIHsdioInstrumentNames() | Returns the instrument names for all NI-HSDIO instruments in the ISemiconductorModuleContext. You can use the instrument names to open driver sessions. |
| GetNIHsdioSession(string, out ulong, out ulong, out string) | Returns the NI-HSDIO acquisition session, generation session, and channel list required to access the pin . If more than one instrument is required to access the pin , the method throws an exception. |
| GetNIHsdioSession(string[], out ulong, out ulong, out string) | Returns the NI-HSDIO acquisition session, generation session, and channel list required to access the pins . If more than one instrument is required to access the pins , the method throws an exception. |
| GetNIHsdioSessions(string[], out ulong[], out ulong[], out string[]) | Returns the NI-HSDIO acquisition sessions, generation sessions, and channel lists required to access the pins . |
| GetNIHsdioSessions(string, out ulong[], out ulong[], out string[]) | Returns the NI-HSDIO acquisition sessions, generation sessions, and channel lists required to access the pin . |
| GetNIRfmxInstrumentNames() | Returns an array of all NI-RFmx instrument names in the ISemiconductorModuleContext. You can use the instrument names to open driver sessions. |
| GetNIRfmxMultipleDeembeddingData(string, out string[], out RFmxInstrMXSParameterOrientation[]) | Returns the NI-RFmx de-embedding data associated with the connections to the pin . If any instrument in the Semiconductor Module context contains more than a single connection to the pin , the method throws an exception. |
| GetNIRfmxSession(string, out RFmxInstrMX, out string) | Returns the NI-RFmx session required to access the pin . If more than one session is required, the method throws an exception. |
| GetNIRfmxSession(string, out RFmxInstrMX) | Returns the NI-RFmx session required to access the pin . If more than one session is required, the method throws an exception. |
| GetNIRfmxSessions(string, out RFmxInstrMX[], out string[]) | Returns the NI-RFmx sessions required to access the pin . |
| GetNIRfmxSessions(string, out RFmxInstrMX[]) | Returns the NI-RFmx sessions required to access the pin . |
| GetNIRfmxSingleDeembeddingData(string, out string, out RFmxInstrMXSParameterOrientation) | Returns the NI-RFmx de-embedding path and orientation associated with the instrument connection to the pin . If more than one connection is found, the method throws an exception. |
| GetNIRfpmInstrumentNames(out string[], out string[], out string[]) | Returns the names of all NI-RFPM subsystems in the ISemiconductorModuleContext. You can use the instrument names, IVI Switch names, FPGA file paths, and calibration file paths to open instrument and calibration sessions. |
| GetNIRfpmSessions(string, out ISemiconductorModuleContext[], out string[], out string[], out DeembeddingS2POrientation[]) | Returns the NI-RFPM subsystem sessions and ports required to access the pin , as well as paths and orientations of the S2P files that characterize the de-embedding network for each port. |
| GetNIRfpmSessions(string[], out ISemiconductorModuleContext[], out string, out string, out DeembeddingS2POrientation) | Returns the NI-RFPM subsystem sessions and ports required to access the pins , as well as paths and orientations of the S2P files that characterize the de-embedding network for each port. |
| GetNIRfpmSessions(string, string, out ISemiconductorModuleContext[], out string[], out string[], out DeembeddingS2POrientation[], out string[], out string[], out DeembeddingS2POrientation[]) | Returns the NI-RFPM sessions and ports required to access pin1 and pin2 , as well as paths and orientations of the S2P files that characterize the de-embedding network for each port. This overload is a convenient option for tests that involve a stimulus and response pin. |
| GetNIRfsaInstrumentNames() | Returns an array of all NI-RFSA instrument names in the ISemiconductorModuleContext. You can use the instrument names to open driver sessions. |
| GetNIRfsaMultipleDeembeddingData(string, out string[], out RfsaSParameterOrientation[]) | Returns the NI-RFSA de-embedding data associated with the connections to the pin . If any instrument in the Semiconductor Module context contains more than a single connection to the pin , the method throws an exception. |
| GetNIRfsaSession(string, out NIRfsa) | Returns the NI-RFSA session required to access the pin . If more than one session is required to access the pin , the method throws an exception. |
| GetNIRfsaSession(string, out NIRfsa, out string) | Returns the NI-RFSA session required to access the pin . If more than one session is required to access the pin , the method throws an exception. |
| GetNIRfsaSessions(string, out NIRfsa[]) | Returns the NI-RFSA sessions required to access the pin . |
| GetNIRfsaSessions(string, out NIRfsa[], out string[]) | Returns the NI-RFSA sessions required to access the pin . |
| GetNIRfsaSingleDeembeddingData(string, out string, out RfsaSParameterOrientation) | Returns the NI-RFSA de-embedding path and orientation associated with the instrument connection to the pin . If more than one connection is found, the method throws an exception. |
| GetNIRfsgInstrumentNames() | Returns an array of all NI-RFSG instrument names in the ISemiconductorModuleContext. You can use the instrument names to open driver sessions. |
| GetNIRfsgMultipleDeembeddingData(string, out string[], out RfsgSParameterOrientation[]) | Returns the NI-RFSG de-embedding data associated with the connections to the pin . If any instrument in the Semiconductor Module context contains more than a single connection to the pin , the method throws an exception. |
| GetNIRfsgSession(string, out NIRfsg) | Returns the NI-RFSG session required to access the pin . If more than one session is required to access the pin , the method throws an exception. |
| GetNIRfsgSession(string, out NIRfsg, out string) | Returns the NI-RFSG session required to access the pin . If more than one session is required to access the pin , the method throws an exception. |
| GetNIRfsgSessions(string, out NIRfsg[], out string[]) | Returns the NI-RFSG sessions required to access the pin . |
| GetNIRfsgSessions(string, out NIRfsg[]) | Returns the NI-RFSG sessions required to access the pin . |
| GetNIRfsgSingleDeembeddingData(string, out string, out RfsgSParameterOrientation) | Returns the NI-RFSG de-embedding path and orientation associated with the instrument connection to the pin . If more than one connection is found, the method throws an exception. |
| GetNIScopeInstrumentNames() | Returns an array of instrument names and comma-separated lists of instrument names that belong to the same group for all NI-SCOPE instruments in the ISemiconductorModuleContext. You can use the instrument names and comma-separated lists of instrument names to open driver sessions. |
| GetNIScopeSession(string[], out NIScope, out string) | Returns the NI-SCOPE session and channel list required to access the pins . If more than one session is required to access the pins , the method throws an exception. Each group of NI-SCOPE instruments in the pin map creates a single instrument session. |
| GetNIScopeSession(string, out NIScope, out string) | Returns the NI-SCOPE session and channel list required to access the pin . If more than one session is required, the method throws an exception. Each group of NI-SCOPE instruments in the pin map creates a single instrument session. |
| GetNIScopeSessions(string, out NIScope[], out string[]) | Returns the NI-SCOPE sessions and channel lists required to access the pin . |
| GetNIScopeSessions(string[], out NIScope[], out string[]) | Returns the NI-SCOPE sessions and channel lists required to access the pins . |
| GetPins(string, out string[], out string[]) | Returns all DUT and system pins available in the ISemiconductorModuleContext that are connected to an instrument of type you specify in the instrumentTypeId . This method returns only the pins specified on the Options tab of the Semiconductor Multi Test step. Pass an empty string to instrumentTypeId to return all available pins. |
| GetPins(string, Capability, out string[], out string[]) | Returns all DUT and system pins available in the ISemiconductorModuleContext that are connected to an instrument of the type you specify in the instrumentTypeId . This method returns only the pins specified on the Options tab of the Semiconductor Multi Test step. Pass an empty string to instrumentTypeId to return all available pins. |
| GetPins(out string[], out string[]) | Returns all DUT and system pins available in the ISemiconductorModuleContext. This method returns only the pins specified on the Options tab of the Semiconductor Multi Test step. |
| GetPins(string, string, out string[], out string[]) | Returns all DUT and system pins available in the ISemiconductorModuleContext that are connected to an instrument of the type you specify in the instrumentTypeId . This method returns only the pins specified on the Options tab of the Semiconductor Multi Test step. Pass an empty string to instrumentTypeId to return all available pins. |
| GetPinsInPinGroup(string) | Returns a list of pins contained in the pin group you specify in the pinGroup . |
| GetPinsInPinGroups(string[]) | Returns a list of pins contained in the pin groups you specify in the pinGroups . |
| GetRelayDriverModuleNames() | Returns an array of all relay driver module names in the ISemiconductorModuleContext. You can use the relay driver module names to open NI-SWITCH driver sessions for the relay driver modules. |
| GetRelayDriverNIDAQmxTask(string, out Task) | Returns the NI-DAQmx task required to control the relay connected to a digital output line of an NI-DAQ module. |
| GetRelayDriverNIDAQmxTasks(string[], out Task[]) | Returns the NI-DAQmx tasks required to control the relays connected to the digital output lines of an NI-DAQ module. |
| GetRelayDriverNIDAQmxTasks(string, out Task[]) | Returns the NI-DAQmx tasks required to control the relays connected to the Digital Output lines of an NI-DAQ module. |
| GetRelayDriverNISwitchSession(string, out NISwitch, out string) | Returns the NI-SWITCH session and relay names required to access the relays connected to a relay driver module. If more than one session is required to access the relay, the method throws an exception. |
| GetRelayDriverNISwitchSession(string[], out NISwitch, out string) | Returns the NI-SWITCH session and relay names required to access the relays connected to a relay driver module. If more than one session is required to access the relays, the method throws an exception. |
| GetRelayDriverNISwitchSessions(string, out NISwitch[], out string[]) | Returns the NI-SWITCH sessions and relay names required to access the relay connected to a relay driver module. |
| GetRelayDriverNISwitchSessions(string[], out NISwitch[], out string[]) | Returns the NI-SWITCH sessions and relay names required to access the relays connected to a relay driver module. |
| GetRelays(out string[], out string[]) | Returns all site and system relays available in the ISemiconductorModuleContext. |
| GetRelaysInRelayGroup(string) | Returns an array of relay names contained in the relay group you specify in the relayGroup . |
| GetRelaysInRelayGroups(string[]) | Returns an array of of relay names contained in the relay groups you specify in the relayGroups . |
| GetSemiconductorModuleContextWithSites(int[]) | Returns a Semiconductor Module context object with only the specified sites. |
| GetSiteData(string) | Returns per-site data that a previous call to the SetSiteData method stores. The returned array contains the data the SiteNumbers property stores for each site in the same order as the sites that the Get Site Numbers method returns. Throws an exception if a data item with the specified dataId does not exist on every site in the ISemiconductorModuleContext. Use the SiteDataExists method to determine if the specified dataId exists. |
| GetSiteData< T >(string) | Returns per-site data that a previous call to the SetSiteData method stores. The returned array contains the data the SiteNumbers property stores for each site in the same order as the sites that the Get Site Numbers method returns. Casts the data to an array of the specified type T . Throws an exception if no data item with the specified dataId exists. Use the SiteDataExists method to determine if the specified dataId exists on every site in the ISemiconductorModuleContext. |
| GetSiteSemiconductorModuleContexts() | Returns an array of Semiconductor Module context objects, each of which represents a single site. The size and ordering of the array match the size and ordering of the SiteNumbers array. |
| GetSpecificationsValue(string) | Returns the value calculated for the namespacedSymbol in the Semiconductor Module Context specifications file. Throws an exception when the associated specifications file or symbol cannot be found. |
| GetSpecificationsValues(params string[]) | Returns the values calculated for the namespacedSymbols in the Semiconductor Module Context specifications file. Throws an exception when the associated specifications file or any symbol cannot be found. |
| GetSwitchExecutiveSessions(string, string, out ISemiconductorModuleContext[], out ulong[], out string[]) | Returns sites based arrays of semiconductor module context, switch executive virtual device sessions, and route names for the given pin and instrument type id. |
| GetSwitchExecutiveVirtualDeviceNames() | Returns the names of all Switch Executive virtual devices in the Semiconductor Module Context. You can use these names to open Switch Executive sessions. |
| GetSwitchNames(string) | Returns the names of all switches of the type specified by the multiplexerTypeId in the Semiconductor Module Context. You can use switch names to open driver sessions. |
| GetSwitchSessions(string, out ISemiconductorModuleContext[], out string[]) | Returns the switch sessions, switch routes, and new Semiconductor Module context objects required to access the specified switched pin for multiplexers that do not have a type ID defined explicitly in the pin map file. Multiplexers in the pin map that do not specify a type ID have a default ID of NIGenericMultiplexer. Omit the argument for this parameter to use the default type ID. |
| GetSwitchSessions(string, string, out ISemiconductorModuleContext[], out string[]) | Returns the switch sessions, switch routes, and new Semiconductor Module context objects required to access the specified switched pin . |
| GlobalDataExists(string) | Returns a Boolean value indicating whether global data exists for the data ID specified by the dataId . |
| OverrideAlarmBehavior(string[], string, AlarmBehavior) | Changes the behavior associated with one or more alarms on pins for all sites in the ISemiconductorModuleContext. The new behavior remains in effect until RestoreAlarmBehavior(string[], string) is called or until the DUT completes testing. TSM restores the alarm behavior for all alarms and pins to the value specified in the Alarms panel of the Test Program Editor before testing each DUT. |
| OverrideAlarmBehavior(string, string, AlarmBehavior) | Changes the behavior associated with one or more alarms on pins for all sites in the ISemiconductorModuleContext. The new behavior remains in effect until RestoreAlarmBehavior(string, string) is called or until the DUT completes testing. TSM restores the alarm behavior for all alarms and pins to the value specified in the Alarms panel of the Test Program Editor before testing each DUT. |
| Publish(string[], string) | This method is deprecated. Use the PublishPerSite(string[], string, string) method instead. |
| Publish(double[], string) | This method is deprecated. Use the PublishPerSite(double[], string, string) method instead. |
| Publish(bool[], string) | This method is deprecated. Use the PublishPerSite(bool[], string, string) method instead. |
| PublishPerSite(string[], string, string) | Publishes strings from multiple sites for the Semiconductor Multi Test step to consume. Use this method when you want to publish data for multiple sites in the same order in which the sites are defined in the ISemiconductorModuleContext. |
| PublishPerSite(bool, string, string) | Publishes a Boolean measurement from a single site for the Semiconductor Multi Test step to consume. Use this method when the ISemiconductorModuleContext has a single site. This method throws an exception if the ISemiconductorModuleContext object contains multiple sites. |
| PublishPerSite(string, string, string) | Publishes a string measurement from a single site for the Semiconductor Multi Test step to consume. Use this method when the ISemiconductorModuleContext has a single site. This method throws an exception if the ISemiconductorModuleContext object contains multiple sites. |
| PublishPerSite(double, string, string) | Publishes a double-precision, floating-point measurement from a single site for the Semiconductor Multi Test step to consume. Use this method when the ISemiconductorModuleContext has a single site. This method throws an exception if the ISemiconductorModuleContext object contains multiple sites. |
| PublishPerSite(bool[], string, string) | Publishes Boolean measurements from multiple sites for the Semiconductor Multi Test step to consume. Use this method when you want to publish data for multiple sites in the same order in which the sites are defined in the ISemiconductorModuleContext. |
| PublishPerSite(double[], string, string) | Publishes double-precision, floating-point measurements from multiple sites for the Semiconductor Multi Test step to consume. Use this method when you want to publish data for multiple sites in the same order in which the sites are defined in the ISemiconductorModuleContext. |
| PublishToTestStandVariablePerSite(string, double[]) | Publishes double-precision, floating-point measurements from multiple sites to the TestStand variable described by the given expression. Use this method when you want to publish data for multiple sites directly to a TestStand variable in the same order in which the sites are defined in the ISemiconductorModuleContext. |
| PublishToTestStandVariablePerSite(string, string[]) | Publishes strings from multiple sites to the TestStand variable described by the given expression. Use this method when you want to publish data for multiple sites directly to a TestStand variable in the same order in which the sites are defined in the ISemiconductorModuleContext. |
| PublishToTestStandVariablePerSite(string, bool) | Publishes a Boolean measurement from a single site to the TestStand variable described by the given expression. Use this method when the ISemiconductorModuleContext has a single site and you want to publish a single value for that site directly to a TestStand variable. This method throws an exception if the ISemiconductorModuleContext object contains multiple sites. |
| PublishToTestStandVariablePerSite(string, string) | Publishes a string measurement from a single site to the TestStand variable described by the given expression. Use this method when the ISemiconductorModuleContext has a single site and you want to publish a single value for that site. directly to a TestStand variable. This method throws an exception if the ISemiconductorModuleContext object contains multiple sites. |
| PublishToTestStandVariablePerSite(string, double) | Publishes a double-precision, floating-point measurement from a single site to the TestStand variable described by the given expression. Use this method when the ISemiconductorModuleContext has a single site and you want to publish a single value for that site directly to a TestStand variable. This method throws an exception if the ISemiconductorModuleContext object contains multiple sites. |
| PublishToTestStandVariablePerSite(string, bool[]) | Publishes Boolean measurements from multiple sites to the TestStand variable described by the given expression. Use this method when you want to publish data for multiple sites directly to a TestStand variable in the same order in which the sites are defined in the ISemiconductorModuleContext. |
| QueryForRaisedAlarms(bool, out string) | Returns true if there are any raised alarms on the sites in the Semiconductor Module context. You can use this method in conditional breakpoints to break execution if an alarm was raised. |
| RestoreAlarmBehavior(string[], string) | Restores the behavior associated with one or more alarms on pins to the values specified in the Alarms panel of the Test Program Editor for all sites in the ISemiconductorModuleContext. TSM restores the alarm behavior for all alarms and pins to the value specified in the Alarms panel of the Test Program Editor before testing each DUT. |
| RestoreAlarmBehavior(string, string) | Restores the behavior associated with one or more alarms on pins to the values specified in the Alarms panel of the Test Program Editor for all sites in the ISemiconductorModuleContext. TSM restores the alarm behavior for all alarms and pins to the value specified in the Alarms panel of the Test Program Editor before testing each DUT. |
| SetCustomSession(string, string, string, object) | Associates a session with an instrument and channel group. |
| SetFpgaVIReference(string, ulong) | Associates an FPGA VI reference with an FPGA-enabled instrument name. |
| SetGlobalData(string, object) | Associates a data item with a dataId . You can use this method to store an instrument session or other data you initialize in a central location but access from multiple sites. The data item is accessible from a process model controller execution and all of its test socket executions. |
| SetNIDAQmxTask(string, Task) | Associates an NI-DAQmx task with an NI-DAQmx task name defined in the pin map. |
| SetNIDCPowerSession(string, string, NIDCPower) | Associates an instrument session with an NI-DCPower instrumentName and channelString . |
| SetNIDCPowerSession(string, NIDCPower) | Associates an NI-DCPower session with all resources of an NI-DCPower resourceString . This method supports only DC Power instruments defined with ChannelGroups in the pin map. |
| SetNIDigitalPatternSession(string, NIDigital) | Associates an instrument session with an NI-Digital Pattern instrumentName . |
| SetNIDmmSession(string, NIDmm) | Associates an instrument session with an NI-DMM instrument name. |
| SetNIFGenSession(string, NIFgen) | Associates an instrument session with an NI-FGEN instrument name. |
| SetNIHsdioSession(string, ulong, ulong) | Associates an NI-HSDIO acquisition session and NI-HSDIO generation session with an NI-HSDIO instrument name. |
| SetNIRfmxSession(string, RFmxInstrMX) | Associates an instrument session with an NI-RFmx instrumentName . |
| SetNIRfpmSession(string, NIRfpm) | Associates an NI-RFPM session and IVI Switch session with an NI-RFPM instrumentName . |
| SetNIRfsaSession(string, NIRfsa) | Associates an instrument session with an NI-RFSA instrumentName . |
| SetNIRfsgSession(string, NIRfsg) | Associates an instrument session with an NI-RFSG instrumentName parameter. |
| SetNIScopeSession(string, NIScope) | Associates an instrument session with an NI-SCOPE instrument name. |
| SetRelayDriverNISwitchSession(string, NISwitch) | Associates an NI-SWITCH session with a relay driver module. |
| SetSiteData(string, object[]) | Associates a data item with each site. You can associate data with all sites or with the sub-set of sites in the ISemiconductorModuleContext. You can use this method to store instrument sessions or other per-site data you initialize in a central location but access within each site. The data item is accessible from a process model controller execution and the site with which the data is associated. |
| SetSiteData< T >(string, T[]) | Associates a data item with each site. You can associate data with all sites or with the sub-set of sites in the ISemiconductorModuleContext. You can use this method to store instrument sessions or other per-site data you initialize in a central location but access within each site. The data item is accessible from a process model controller execution and the site with which the data is associated. |
| SetSwitchExecutiveSession(string, ulong) | Associates an open Switch Executive session with the switchExecutiveVirtualDeviceName . This name should match the name of a virtual device in Switch Executive. |
| SetSwitchSession(string, string, object) | Associates an open switch session with the switchName for a multiplexer of type multiplexerTypeId . |
| SetSwitchSession(string, object) | Associates an open switch session with the switchName for a multiplexer that does not have a type ID defined explicitly in the pin map file. Multiplexers in the pin map that do not specify a type ID have a default ID of NIGenericMultiplexer. |
| SiteDataExists(string) | Returns a Boolean value indicating whether site data exists for the data ID specified by the dataId . Throws an exception if a data item with the specified dataId exists for some, but not all, sites in the ISemiconductorModuleContext. |