Returns per-site double-precision, floating-point data as defined in the Semiconductor Multi Test step. The return value is an array of the per-site double-precision, floating-point data associated with the Data Source column for the row with a matching pin  and inputDataId  values of the Per-Site Inputs table on the Per-Site Inputs tab of the Semiconductor Multi Test step.

Syntax

Namespace: NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI

public double[] GetInputDataAsDoubles(string pin="", string inputDataId="")

Parameters

NameTypeDescription
pinstring

The name of the pin associated with the data. This parameter must match a value you specify in the Pin column on the Per-Site Inputs tab of the Semiconductor Multi Test step. If you pass a blank pin, you don't have to specify a pin name in the step.

inputDataIdstring

The unique ID to distinguish the data. This parameter must match a value you specify on the Per-Site Inputs tab of the Semiconductor Multi Test step.