TestStand Semiconductor Module Code Module API: NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIRfmxSinglePinSingleSessionQueryContext Class Reference
- Updated2025-09-26
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TestStand Semiconductor Module Code Module API
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NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIRfmxSinglePinSingleSessionQueryContext Class Reference
An object the GetNIRfmxSession method returns to track the session and channel associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements. More...
Inheritance diagram for NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIRfmxSinglePinSingleSessionQueryContext:
Additional Inherited Members | |
Public Member Functions inherited from NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinSingleSessionQueryContext | |
| void | Publish (bool[] data, string publishedDataId="") |
| Publishes measurement data for a single pin to the Semiconductor Multi Test step for all sites in the SemiconductorModuleContext. More... | |
| void | Publish (double[] data, string publishedDataId="") |
| Publishes measurement data for a single pin to the Semiconductor Multi Test step for all sites in the SemiconductorModuleContext. More... | |
| void | Publish (bool data, string publishedDataId="") |
| Publishes measurement data for a single pin to the Semiconductor Multi Test step for all sites in the SemiconductorModuleContext. More... | |
| void | Publish (double data, string publishedDataId="") |
| Publishes measurement data for a single pin to the Semiconductor Multi Test step for all sites in the SemiconductorModuleContext. More... | |
Public Member Functions inherited from NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinQueryContext | |
| double [] | ExtractPinData (double[] data) |
| Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(double[], string). More... | |
| double [] | ExtractPinData (double[][] data) |
| Returns multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(double[][], string). More... | |
| bool [] | ExtractPinData (bool[] data) |
| Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(bool[], string). More... | |
| bool [] | ExtractPinData (bool[][] data) |
| Returns multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(bool[][], string). More... | |
| void | GetSessionAndChannelIndex (int siteNumber, out int sessionIndex, out int channelIndex) |
| Returns the index of the session and channel that corresponds to a pin query. Use this method to access an individual pin on a specific site when you take a measurement across multiple instrument sessions. When you call a pin query method, such as the GetNIHsdioSessions, the method returns an array of sessions and an array of channel lists. Use this method to identify which session and which channel refers to the pin from the pin query and the site number you specify. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.GetSessionAndChannelIndex. More... | |
Public Member Functions inherited from NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.PinQueryContext | |
| double [] | ExtractPinData (double[] data, string pin) |
| Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. More... | |
| double [] | ExtractPinData (double[][] data, string pin) |
| Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. More... | |
| bool [] | ExtractPinData (bool[] data, string pin) |
| Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. More... | |
| bool [] | ExtractPinData (bool[][] data, string pin) |
| Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. More... | |
| void | GetSessionAndChannelIndex (int siteNumber, string pin, out int sessionIndex, out int channelIndex) |
| Returns the index of the session and channel that corresponds to a pin query. Use this method to access an individual pin on a specific site when you take a measurement across multiple instruments. When you call a pin query method, such as the GetNIHsdioSessions, the method returns an array of sessions and an array of channel lists. Use this method to identify which session and which channel refers to the pin from the pin query and the site number you specify. More... | |
| T [][] | PerInstrumentToPerSiteData< T > (T[] perInstrumentData) |
| Converts measurement data from a 1D array of the specified type T that is ordered by channels on a single instrument session into an array of arrays that is arranged by the sites and pins in the Semiconductor Module Context. More... | |
Detailed Description
An object the GetNIRfmxSession method returns to track the session and channel associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.
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Public Member Functions inherited from