TestStand Semiconductor Module Code Module .NET API

TestStand Semiconductor Module Code Module API: NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinQueryContext Class Reference

  • Updated2025-09-26
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NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinQueryContext Class Reference

Provides the base class for a single pin query context, which is an object a pin query method returns to track the sessions and channels associated with a single pin for one or more sites. More...

Inheritance diagram for NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinQueryContext:
NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.PinQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinMultipleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinSingleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIDAQmxSinglePinMultipleTaskQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIDCPowerSinglePinMultipleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIDmmSinglePinMultipleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIFGenSinglePinMultipleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIHsdioSinglePinMultipleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIRfmxSinglePinMultipleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIRfsaSinglePinMultipleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIRfsgSinglePinMultipleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIScopeSinglePinMultipleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIDAQmxSinglePinSingleTaskQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIDCPowerSinglePinSingleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIDmmSinglePinSingleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIFGenSinglePinSingleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIHsdioSinglePinSingleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIRfmxSinglePinSingleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIRfsaSinglePinSingleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIRfsgSinglePinSingleSessionQueryContext NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.NIScopeSinglePinSingleSessionQueryContext

Public Member Functions

double [] ExtractPinData (double[] data)
 Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(double[], string). More...
 
double [] ExtractPinData (double[][] data)
 Returns multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(double[][], string). More...
 
bool [] ExtractPinData (bool[] data)
 Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(bool[], string). More...
 
bool [] ExtractPinData (bool[][] data)
 Returns multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(bool[][], string). More...
 
void GetSessionAndChannelIndex (int siteNumber, out int sessionIndex, out int channelIndex)
 Returns the index of the session and channel that corresponds to a pin query. Use this method to access an individual pin on a specific site when you take a measurement across multiple instrument sessions. When you call a pin query method, such as the GetNIHsdioSessions, the method returns an array of sessions and an array of channel lists. Use this method to identify which session and which channel refers to the pin from the pin query and the site number you specify. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.GetSessionAndChannelIndex. More...
 
- Public Member Functions inherited from NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.PinQueryContext
double [] ExtractPinData (double[] data, string pin)
 Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. More...
 
double [] ExtractPinData (double[][] data, string pin)
 Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. More...
 
bool [] ExtractPinData (bool[] data, string pin)
 Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. More...
 
bool [] ExtractPinData (bool[][] data, string pin)
 Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. More...
 
void GetSessionAndChannelIndex (int siteNumber, string pin, out int sessionIndex, out int channelIndex)
 Returns the index of the session and channel that corresponds to a pin query. Use this method to access an individual pin on a specific site when you take a measurement across multiple instruments. When you call a pin query method, such as the GetNIHsdioSessions, the method returns an array of sessions and an array of channel lists. Use this method to identify which session and which channel refers to the pin from the pin query and the site number you specify. More...
 
T [][] PerInstrumentToPerSiteData< T > (T[] perInstrumentData)
 Converts measurement data from a 1D array of the specified type T that is ordered by channels on a single instrument session into an array of arrays that is arranged by the sites and pins in the Semiconductor Module Context. More...
 

Detailed Description

Provides the base class for a single pin query context, which is an object a pin query method returns to track the sessions and channels associated with a single pin for one or more sites.

Member Function Documentation

◆ ExtractPinData() [1/4]

double [] NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinQueryContext.ExtractPinData ( double []  data)
inline

Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(double[], string).

Parameters
dataThe multisite measurement data from a single pin connected to a single instrument session. Each element in the array represents a measurement made for a single channel from the same instrument session.
Returns
The multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext.

◆ ExtractPinData() [2/4]

double [] NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinQueryContext.ExtractPinData ( double  data[][])
inline

Returns multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(double[][], string).

Parameters
dataThe multisite measurement data from a single pin connected to multiple instrument sessions. The data is in the form of an array of arrays. Each element in the data array is an array that contains the measurements for the channels of a single instrument session. The size of the data array must be the same size as the session data output from the pin query method.
Returns
The multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext.

◆ ExtractPinData() [3/4]

bool [] NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinQueryContext.ExtractPinData ( bool []  data)
inline

Returns the measurement data arranged in the order of sites in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(bool[], string).

Parameters
dataThe multisite measurement data from a single pin connected to a single instrument session. Each element in the array represents a measurement made for a single channel from the same instrument session.
Returns
The multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext.

◆ ExtractPinData() [4/4]

bool [] NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinQueryContext.ExtractPinData ( bool  data[][])
inline

Returns multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.ExtractPinData(bool[][], string).

Parameters
dataThe multisite measurement data from a single pin connected to multiple instrument sessions. The data is in the form of an array of arrays. Each element in the data array is an array that contains the measurements for the channels of a single instrument session. The size of the data array must be the same size as the session data output from the pin query method.
Returns
The multisite measurement data rearranged into a single array with the order of the elements matching the site order in the SemiconductorModuleContext.

◆ GetSessionAndChannelIndex()

void NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI.SinglePinQueryContext.GetSessionAndChannelIndex ( int  siteNumber,
out int  sessionIndex,
out int  channelIndex 
)
inline

Returns the index of the session and channel that corresponds to a pin query. Use this method to access an individual pin on a specific site when you take a measurement across multiple instrument sessions. When you call a pin query method, such as the GetNIHsdioSessions, the method returns an array of sessions and an array of channel lists. Use this method to identify which session and which channel refers to the pin from the pin query and the site number you specify. Note: This method throws an exception if the string passed to the pin parameter of the pin query is the name of a pin group that contains more than one pin. For this situation, use PinQueryContext.GetSessionAndChannelIndex.

Parameters
siteNumberThe site number of the pin to obtain the session and channel index in a previous pin query. For a system pin, pass any valid site number.
sessionIndexReturns the index of the session for a measurement taken on the pin and site number you specify.
channelIndexReturns the index of the channel within the channel list for a measurement taken on the pin and site number you specify.