Here are the classes, structs, unions and interfaces with brief descriptions:

[detail level 12345]

▼NNationalInstruments
▼NTestStand
▼NSemiconductorModule
▼NCodeModuleAPI
CIModelBasedInstrument	Model-based instruments are an instrument type that is defined in the PinMap and based on a user-selected instrument model. Instrument models define instruments that consist of multiple hardware resources and require more complex and flexible connection and configuration information. The IModelBasedInstrument object contains information about properties for the instrument and the hardware resources the instrument needs as defined by the instrument model
CIModelBasedPropertyItemContainer	Describes the methods to access the model-based instruments property values
CIModelBasedResource	The IModelBasedResource object contains properties for the hardware resources as defined in the model for the instrument. You can use this object to retrieve the properties needed to create the instrument sessions
CInstrumentTypeIdConstants	The type IDs for non-custom instruments in the pin map file
CISemiconductorModuleContext	The Semiconductor Multi Test step creates an ISemiconductorModuleContext object that describes a subset of pins, relays, sites, and instruments on a test system for the instance of the multisite code module. Pass the Step.SemiconductorModuleContext property to the code module as an ISemiconductorModuleContext interface to write a test for multisite situations
CModelBasedInstrumentSearchOptions	Specifies the category and (optional) subcategory of instruments to search for when querying for model-based instruments in the ISemiconductorModuleContext. All model-based instruments belong to a category and can additionally belong to a subcategory as defined in the model for the instrument
CMultiplePinMultipleSessionQueryContext	Provides the base class for a multiple pin/multiple session query context, which is an object a pin query method, such as GetNIDCPowerSessions, returns to track the sessions and channels associated with one or more pins for one or more sites connected to one or more instrument sessions
CMultiplePinQueryContext	Provides the base class for a multiple pin query context, which is an object a pin query method returns to track the sessions and channels associated with one or more pins for one or more sites
CMultiplePinSingleSessionQueryContext	Provides the base class for a multiple pin/single session query context, which is an object a pin query method, such as GetCustomSession, returns to track the session and channels associated with one or more pins for one or more sites connected to a single instrument session
CNIDAQmxMultiplePinMultipleTaskQueryContext	An object the GetNIDAQmxTasks method returns to track the Tasks associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDAQmxMultiplePinSingleTaskQueryContext	An object the GetNIDAQmxTask method returns to track the Task associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDAQmxSinglePinMultipleTaskQueryContext	An object the GetNIDAQmxTasks method returns to track the Tasks associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDAQmxSinglePinSingleTaskQueryContext	An object the GetNIDAQmxTask method returns to track the Task associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDCPowerMultiplePinMultipleSessionQueryContext	An object the GetNIDCPowerSessions method returns to track the sessions and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDCPowerMultiplePinSingleSessionQueryContext	An object the GetNIDCPowerSession method returns to track the session and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDCPowerSinglePinMultipleSessionQueryContext	An object the GetNIDCPowerSessions method returns to track the sessions and channels associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDCPowerSinglePinSingleSessionQueryContext	An object the GetNIDCPowerSession method returns to track the session and channels associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDigitalExtensions	Methods that extend the functionality of the NIDigital session class for TestStand Semiconductor Module
CNIDigitalHistoryRamCycleInformation	Contains information about cycles obtained from NIDigital History RAM for a single NIDigital session with multiple sites. The NIDigitalExtensions.FetchMultisiteHistoryRamInformation extension method returns an instance of this class. Use instances of this class with the NIDigitalPatternSingleSessionPinQueryContext.PublishPatternResults(bool[], NIDigitalHistoryRamCycleInformation, string) or NIDigitalPatternPinQueryContext.PublishPatternResults(bool[][], NIDigitalHistoryRamCycleInformation[], string)method to record cycle information in the STDF data log
CNIDigitalPatternPinQueryContext	An object the GetNIDigitalPatternSessions method returns to track the sessions and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and to extract data from a set of measurements
CNIDigitalPatternSingleSessionPinQueryContext	An object the GetNIDigitalPatternSession method returns to track the session and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and to extract data from a set of measurements
CNIDmmMultiplePinMultipleSessionQueryContext	An object the GetNIDmmSessions method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDmmSinglePinMultipleSessionQueryContext	An object the GetNIDmmSessions method returns to track the sessions associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIDmmSinglePinSingleSessionQueryContext	An object the GetNIDmmSession method returns to track the session associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIFGenMultiplePinMultipleSessionQueryContext	An object the GetNIFGenSessions method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIFGenMultiplePinSingleSessionQueryContext	An object the GetNIFGenSession method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIFGenSinglePinMultipleSessionQueryContext	An object the GetNIFGenSessions method returns to track the sessions associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIFGenSinglePinSingleSessionQueryContext	An object the GetNIFGenSession method returns to track the session associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIHsdioMultiplePinMultipleSessionQueryContext	An object the GetNIHsdioSessions method returns to track the sessions and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step, extract data from a set of measurements, and create or rearrange waveforms
CNIHsdioMultiplePinSingleSessionQueryContext	An object the GetNIHsdioSession method returns to track the sessions and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step, extract data from a set of measurements, and create or rearrange waveforms
CNIHsdioSinglePinMultipleSessionQueryContext	An object the GetNIHsdioSessions method returns to track the sessions and channels associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step, extract data from a set of measurements, and create or rearrange waveforms
CNIHsdioSinglePinSingleSessionQueryContext	An object the GetNIHsdioSession method returns to track the sessions and channels associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step, extract data from a set of measurements, and create or rearrange waveforms
CNIRfmxSinglePinMultipleSessionQueryContext	An object the GetNIRfmxSessions method returns to track the session and channel associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIRfmxSinglePinSingleSessionQueryContext	An object the GetNIRfmxSession method returns to track the session and channel associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIRfsaSinglePinMultipleSessionQueryContext	An object the GetNIRfsaSessions method returns to track the session and channel associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIRfsaSinglePinSingleSessionQueryContext	An object the GetNIRfsaSession method returns to track the session and channel associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIRfsgSinglePinMultipleSessionQueryContext	An object the GetNIRfsgSessions method returns to track the session and channel associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIRfsgSinglePinSingleSessionQueryContext	An object the GetNIRfsgSession method returns to track the session and channel associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIScopeMultiplePinMultipleSessionQueryContext	An object the GetNIScopeSessions method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIScopeMultiplePinSingleSessionQueryContext	An object the GetNIScopeSession method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIScopeSinglePinMultipleSessionQueryContext	An object the GetNIScopeSessions method returns to track the sessions associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CNIScopeSinglePinSingleSessionQueryContext	An object the GetNIScopeSession method returns to track the session associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements
CPinQueryContext	Provides the base class for a pin query context, which is an object a pin query method returns to track the sessions and channels associated with the pins for one or more sites
CSemiconductorModuleContextFactory	Use this class to get an ISemiconductorModuleContext object from the SemiconductorModuleContext step property of a TSM step that does not use the .NET adapter
CSinglePinMultipleSessionQueryContext	Provides the base class for a single pin/multiple session query context, which is an object a pin query method returns to track the session and channels associated with a single pin for one or more sites connected to one or more instrument sessions
CSinglePinQueryContext	Provides the base class for a single pin query context, which is an object a pin query method returns to track the sessions and channels associated with a single pin for one or more sites
CSinglePinSingleSessionQueryContext	Provides the base class for a single pin/single session query context, which is an object a pin query method returns to track the session and channels associated with a single pin for one or more sites connected to a single instrument session

TestStand Semiconductor Module Code Module .NET API

Table of Contents

TestStand Semiconductor Module Code Module API: Class List

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