NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI

Names of the alarms used by the DisableAlarms and EnableAlarms methods.

The type IDs for non-custom instruments in the pin map file.

Specifies the category and (optional) subcategory of instruments to search for when querying for model-based instruments in the ISemiconductorModuleContext. All model-based instruments belong to a category and can additionally belong to a subcategory as defined in the model for the instrument.

Provides the base class for a multiple pin/multiple session query context, which is an object a pin query method, such as GetNIDCPowerSessions, returns to track the sessions and channels associated with one or more pins for one or more sites connected to one or more instrument sessions.

Provides the base class for a multiple pin query context, which is an object a pin query method returns to track the sessions and channels associated with one or more pins for one or more sites.

Provides the base class for a multiple pin/single session query context, which is an object a pin query method, such as GetCustomSession, returns to track the session and channels associated with one or more pins for one or more sites connected to a single instrument session.

An object the GetNIDAQmxTasks method returns to track the Tasks associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIDAQmxTask method returns to track the Task associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIDAQmxTasks method returns to track the Tasks associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIDAQmxTask method returns to track the Task associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIDCPowerSessions method returns to track the sessions and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIDCPowerSession method returns to track the session and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIDCPowerSessions method returns to track the sessions and channels associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIDCPowerSession method returns to track the session and channels associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

Methods that extend the functionality of the NIDigital session class for TestStand Semiconductor Module.

Contains information about cycles obtained from NIDigital History RAM for a single NIDigital session with multiple sites. The FetchMultisiteHistoryRamInformation extension method returns an instance of this class. Use instances of this class with the PublishPatternResults(bool[], NIDigitalHistoryRamCycleInformation, string) or PublishPatternResults(bool[][], NIDigitalHistoryRamCycleInformation[], string)method to record cycle information in the STDF data log.

An object the GetNIDigitalPatternSessions method returns to track the sessions and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and to extract data from a set of measurements.

An object the GetNIDigitalPatternSession method returns to track the session and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and to extract data from a set of measurements.

An object the GetNIDmmSessions method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIDmmSessions method returns to track the sessions associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIDmmSession method returns to track the session associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIFGenSessions method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIFGenSession method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIFGenSessions method returns to track the sessions associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIFGenSession method returns to track the session associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIHsdioSessions method returns to track the sessions and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step, extract data from a set of measurements, and create or rearrange waveforms.

An object the GetNIHsdioSession method returns to track the sessions and channels associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step, extract data from a set of measurements, and create or rearrange waveforms.

An object the GetNIHsdioSessions method returns to track the sessions and channels associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step, extract data from a set of measurements, and create or rearrange waveforms.

An object the GetNIHsdioSession method returns to track the sessions and channels associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step, extract data from a set of measurements, and create or rearrange waveforms.

An object the GetNIRfmxSessions method returns to track the session and channel associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIRfmxSession method returns to track the session and channel associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIRfsaSessions method returns to track the session and channel associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIRfsaSession method returns to track the session and channel associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIRfsgSessions method returns to track the session and channel associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIRfsgSession method returns to track the session and channel associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIScopeSessions method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIScopeSession method returns to track the sessions associated with the pins for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIScopeSessions method returns to track the sessions associated with the pin for one or more sites. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

An object the GetNIScopeSession method returns to track the session associated with the pin. Use this object to publish measurements to the Semiconductor Multi Test step and extract data from a set of measurements.

Provides the base class for a pin query context, which is an object a pin query method returns to track the sessions and channels associated with the pins for one or more sites.

Use this class to get an ISemiconductorModuleContext object from the SemiconductorModuleContext step property of a TSM step that does not use the .NET adapter.

Provides the base class for a single pin/multiple session query context, which is an object a pin query method returns to track the session and channels associated with a single pin for one or more sites connected to one or more instrument sessions.

Provides the base class for a single pin query context, which is an object a pin query method returns to track the sessions and channels associated with a single pin for one or more sites.

Provides the base class for a single pin/single session query context, which is an object a pin query method returns to track the session and channels associated with a single pin for one or more sites connected to a single instrument session.

Model-based instruments are an instrument type that is defined in the PinMap and based on a user-selected instrument model. Instrument models define instruments that consist of multiple hardware resources and require more complex and flexible connection and configuration information. The IModelBasedInstrument object contains information about properties for the instrument and the hardware resources the instrument needs as defined by the instrument model.

Describes the methods to access the model-based instruments property values.

The IModelBasedResource object contains properties for the hardware resources as defined in the model for the instrument. You can use this object to retrieve the properties needed to create the instrument sessions.

The Semiconductor Multi Test step creates an ISemiconductorModuleContext object that describes a subset of pins, relays, sites, and instruments on a test system for the instance of the multisite code module. Pass the Step.SemiconductorModuleContext property to the code module as an ISemiconductorModuleContext interface to write a test for multisite situations.

Behaviors that define how TSM responds to alarms that are raised during testing.

Differentiates between pins in the same instrument with different capabilities, such as NI-HSDIO Dynamic DIO channels and PFI lines.

Actions that the relay driver module can perform on the relays.