Publishes measurement data for a single pin to the Semiconductor Multi Test step for all sites in the SemiconductorModuleContext.

Syntax

Namespace: NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI

public void Publish(bool data, string publishedDataId="")

Parameters

NameTypeDescription
databool

The multisite measurement data from a single pin connected to a single instrument session.

publishedDataIdstring

The unique ID for distinguishing the measurement when you publish multiple measurements for the same pins within the same code module. This ID must match one of the values in the Published Data Id column on the Tests tab of the Semiconductor Multi Test step.