Use System View to edit settings and measurements for pins and relays. This applies to an active pin and an active channel map connected to a digital pattern instrument, NI-DCPower instrument, or relay driver module.

This view contains a list of patterns and source waveforms loaded on the digital instruments. The following table displays the information that each list type contains.

Note For more information on vector memory and source waveforms, refer to the relevant section of the PXIe-6570 User Manual and the PXIe-6570 Specifications publications.
List Type Details
Patterns
Contains the following information:
  • Number of fast vectors
  • Number of cache vectors
  • Number of large vectors
  • Total vector usage
Source Waveforms

Contains the following information:

  • Number of bytes used by each loaded source waveform
  • Total memory usage

Use this view to edit pattern sequencer flags and registers. Interactively debug and make changes to the state of your digital pattern instruments, NI-DCPower instruments, or relays.

Note As of NI-Digital Pattern 2024 Q2, the System View displays the following pins:
  • NI-DMM
  • NI-SCOPE
  • NI-FGEN
  • NI-RFSA
  • NI-RFSG
  • NI-DAQmx
These pins do not support all attributes.
You must install drivers to access additional behaviors in the Digital Pattern Editor:
  • Install the NI-DCPower driver for the NI-DCPower-related functionality.
  • Install the NI-DAQmx driver for the relay driver functionality.

Select Instruments » New System View or View » New System View to launch this view. You can configure a custom layout by resizing columns. Move the column to a new location by dragging the column heading. Sort the rows in the table by clicking the column heading. The layout customizations do not persist when you close the view. You can copy and paste data from the grid. The targets include spreadsheet applications and text editors. These applications must support tab-delimited clipboard text.

When measurements are not up to date, the Pin View pane and System View display a yellow warning icon. The icon displays when the following conditions are met:
  • The Digital Pattern Editor is connected to existing instrument sessions.
  • An instrument session owner, typically a test program application, is actively using the instrument session.
Click the icon to take control of the instrument and acquire new measurement values in the background,. The warning icon returns when the instrument session owner actively uses the instrument sessions again.
Rows for disabled sites display in gray. When you remove the checkmark from the Pattern Burst checkbox of a site in the Sites dialog box, the site does not become disabled. You can still:
  • View the site in the System View.
  • Modify pins in the site in the Pin View or the System View pane.
However, bursting the pattern has no effect on the site.
Edit individual cells to change the state of your digital pattern instruments, NI-DCPower instruments, or relays. To edit multiple cells at once:
  1. Copy a cell with the desired value.
  2. Select the cells you want to edit.
  3. Paste the value into the selected cells.

Use the Disconnect All Digital Pins button in the Function column to change the state of all digital pins to disconnect from another supported state.

Toggle the relay state using the checkbox in the State column. This checkbox is located in the Relays section of the document.
  • To set the relay to "closed," add a checkmark to the state checkbox.
  • To set the relay to "open," remove the checkmark.
  • To change the state of multiple relays at once, select multiple checkbox cells in the grid. Change the state using the mouse or by pressing the space-bar key.

Toggle the state of a pattern sequencer flag through the corresponding checkbox in the Pattern Sequencer Flags section of the document. You can change the value of a pattern sequencer register by editing the corresponding cell in the Pattern Sequencer Registers section of the document.

Use System View commands to navigate to other locations outside of Digital Pattern Editor.
  • Launch InstrumentStudio for an item: Right-click a source measure unit (SMU), data acquisition, digital multimeter, radio frequency (RF), oscilloscope, and waveform generator pin. Then, select Go to InstrumentStudio.
  • Launch InstrumentStudio for a pin map: Right-click a pin map file in the Project Files View. Then, select Go to InstrumentStudio.
  • Navigate to the Pin View pane for a pin: Right-click a Digital or DCPower pin.Then, select Go to Pin View.

Use the Track Changes toggle button in the toolbar. This button allows you to begin tracking changes to non-measurement cell values. You can also stop tracking changes when needed. When you enable tracking, changes to tracked cell values become highlighted. The cell tooltip displays the tracked value. When you disable tracking, the highlighting disappears. This feature helps debug changes that running different parts of a test program can cause.