In the pattern document, select cells in the columns for the pins or pin groups for which you want the digital pattern instrument to ignore failures when you burst the pattern, right-click, and select Mask Compares on Selected Pins from the context menu. Select cells in the columns for masked pins or pin groups, right-click, and select Unmask Compares on Selected Pins from the context menu to remove the setting. These settings persist only until you close the instrument sessions.

When you mask compares on pins or pin groups, the digital pattern editor dims the column background and compare pin states for the pin or pin group in the pattern document, including in History RAM overlay mode, and in the History RAM View. The background is dimmed when the pin or pin group is set to mask compares on the next burst, and the compare pin states for a pin or pin group are dimmed if compares were masked when the pattern was last burst. If not all pins in a pin group are masked, the editor dims only the compare pin states for the masked pins, not the entire pin group, and the header of the pin group column displays the text partially masked.