This document contains the NI-Digital Pattern Driver known issues that were discovered before and since the release of NI-Digital Pattern Driver 2024 Q3. Known issues are performance issues or technical bugs that NI has acknowledged exist within this version of the product.
Not every issue known to NI appears on this list; it is intended to show the most severe and common issues that you may encounter and provide workarounds when possible. Other technical issues that you may encounter could occur through normal product use or system compatibility issues. You may find more information on these issues in NI’s Product Documentation, Knowledgebase, or Community; see Additional Resources.
|
Bug Number |
Legacy ID |
Description |
Details |
|---|---|---|---|
| 1466065 |
Capturing History RAM on a pattern with Scan opcode may not work correctlyWhen using multiple Scan opcodes in a pattern and triggering History RAM on pattern label with a vector offset past the first Scan opcode, History RAM will return 0 samples. Workaround: Configure History RAM to trigger based on cycle offset instead of vector offset. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 19.0.1 | NI-Digital Pattern Driver and Digital Pattern Editor 20.6 Resolved Version: N/A Added: Jul 23, 2021 |
|
| 2867828 |
DUT pins output incorrectly when performing a scan pattern using at least 16 scan pinsWhen performing a scan pattern which contains at least 16 scan pins, any DUT pins in the pattern may not be properly applied. For patterns that use at least 16 scan pins, the driver is not applying the correct data to the DUT pins during the scan cycle. The correct behavior is that the DUT pins' state at the beginning of the scan pattern shall be repeated during each scan cycle.
Workaround: There is currently no known workaround for this issue. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 19.0 | NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Patch 1 Added: N/A |
|
| 2889844 |
Loading a pin map returns an error if an instrument in the pin map does not follow NI-Digital instrument resource name rulesWhen niDigital_LoadPinMap() is called, it incorrectly attempts to validate the names of all instruments in the pin map according to the naming rules for NI-Digital. This can cause errors if, for instance, an NI-DAQmx instrument is named using characters such as a '/'. Workaround: Do not name other instruments using characters (e.g. '/') which are not recognized as valid characters for an NI-Digital resource name.
|
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Patch 1 Added: N/A |
|
| 2917471 |
When sourcing waveforms with a site disabled, an underflow error may occurWhen using a pin map with multiple sites, if one site is disabled, niDigital Burst Pattern may return error -1074118619, "The pattern sequencer overflowed source memory during a pattern burst...". Workaround: Use a pin map that has the disabled site entirely removed.
|
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2023 Q3 | NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Patch 2 Added: N/A |
|
| 2976055 |
Scan compression does not occur for instruments when no pins are configured as scan pinsWhen loading a pattern that contains a scan vector on an instrument that does not have any mapped scan pins, no scan pattern compression will occur. Workaround: Configure at least one pin as a scan pin on every instrument in the session.
|
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q2 Added: Apr 3, 2025 |
|
| 2976055 |
Reported memory usage may be inaccurate with multi-instrument sessions when instruments have different numbers of scan pinsWhen loading a pattern in a multi-instrument session where every instrument does not have the same number of scan pins, the reported memory usage in Digital Pattern Editor may be inaccurate. Workaround: Configure the same number of scan pins on every instrument in the session.
|
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q2 Added: Apr 3, 2025 |
|
| 2815502 |
Digital Pattern Editor does not create Tasks for NI-DAQmx-based relaysIf not already present, Digital Pattern Editor should create Tasks for any relays on NI-DAQmx instruments used in a pin map when the "Create Owned Sessions" button is pressed. These Tasks are not being created.
Workaround: Manually create the NI-DAQmx Task using NI Hardware Configuration Utility for any relays in the pin map that are on NI-DAQmx instruments.
|
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Patch 1 Added: Apr 3, 2025 |
|
| 2795788 |
Digital Scope should constrain compare strobe edge within time-set periodFor patterns with multiple adjacent high frequency cycles, the Digital Scope operation may incorrectly place time-set comparator edges, violating hardware timing limits and resulting in incorrect noisy signals. Workaround: There is currently no known workaround for this issue. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q2 Added: Apr 3, 2025 |
|
| 2902761 |
When using Digital Pattern Editor with an older version of TestStand Semiconductor Module installed, System View may not display live measurementsWhen using Digital Pattern Editor with an older version of TestStand Semiconductor Module installed, System View may not display live measurements. This applies to TestStand Semiconductor Module versions 2024Q1 and earlier.
Workaround: There is currently no known workaround for this issue. |
Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2025 Q2 Added: Apr 3, 2025 |
|
| 3232971 |
Unsigned Installer Packages Flagged by Some Security ScannersThe NI-Digital Pattern Driver 2024 Q3, 2024 Q3 Patch 1, and 2024 Q3 Patch 2 are missing some digital signatures. This causes some security tools to prevent them from loading properly.
Workaround: Upgrade to NI-Digital Pattern Driver 2024 Q3 Patch 3 or newer.
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Reported Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Resolved Version: NI-Digital Pattern Driver and Digital Pattern Editor 2024 Q3 Patch 3 Added: Aug 14, 2025 |
Issues found in this section will not be listed in future known issues documents for this product.
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