Semiconductor Production Test of MEMS Sensors and Actuators
Production testing of microelectromechanical systems (MEMS) electrical performance is crucial for ensuring the reliability and functionality of devices that power modern innovations, from smartphones and automobiles to industrial equipment. As the global economy relies increasingly on MEMS for sensors and actuators, efficient, accurate testing ensures quality while controlling costs in high-volume manufacturing. However, testing MEMS devices can present unique challenges since you need both high-performance electrical instrumentation and various physical stimuli for the MEMS structures.
Modern MEMS production test solutions require:
- High-site-count ATE with high throughput
- Excellent analog performance
- Higher digital pin count
- Tight integration between ATE and handler
- Increasing need for LCR parametric measurements
NI + Partner Integrated Test Cell Solution for MEMS Production Test
- Based on the NI Semiconductor Test System (STS), a production-ready ATE solution
- Underpinned by the NI PXI platform, renowned for its high performance, flexibility, and reliability
- Driven by NI Semiconductor Test System Development Software, helping you develop, execute, debug, and deploy semiconductor test applications
Solution Advantages
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NI ATE and software bring lab-grade performance in production, best-in-class cost-performance ratio, and platform scalability and reuse
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MEMS handler and stimulus options also focused on high throughput, small footprint, and high performance
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A fully integrated (NI + partner) solution lowers total cost of ownership and results in shorter time to market through reference architectures and by offloading heavy processing to FPGAs
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Noteworthy performance metrics include high parallel test efficiency (>98%), high throughput (1:10,000 jams), small footprint (1.5X–4X smaller), and the ability to test high-SNR DUTs (for example, >68 dB)
For Custom or Do-It-Yourself Systems, Consider a PXI Configuration
If you’d prefer to build your own custom test solution, you can leverage the same compact and modular PXI instrumentation used inside the STS. Configure a PXI system with the desired mix of DC, digital, or AC instruments that can be integrated into a custom and cost-effective test solution
BUILD YOUR SOLUTION WITH THE NI ECOSYSTEM
NI offers a variety of solution integration options customized to your application-specific requirements. You can use your own internal integration teams for full system control or leverage the expertise of NI and our worldwide NI Partner Network to obtain a turnkey solution.
The NI Partner Network is a global community of domain, application, and overall test development experts working closely with NI to meet the needs of the engineering community. NI Partners are trusted solution providers, systems integrators, consultants, product developers, and services and sales channel experts skilled across a wide range of industries and application areas.
NI works with customers throughout the life of an application, delivering training, technical support, consultation and integration services, and maintenance programs. Teams can discover new skills by participating in NI-specific and geographic user groups and build proficiency with online and in-person training.
MEMS Production Test with STS
Microelectromechanical systems (MEMS) devices are growing more common and more complex, requiring high throughput and high accuracy test solutions. This application note explores the critical aspects of MEMS testing in a production environment and the advantages of the NI Semiconductor Test System.
An NI Partner is a business entity independent from NI and has no agency or joint-venture relationship and does not form part of any business associations with NI.