MEMS Production Test with NI Semiconductor Test System

Microelectromechanical systems (MEMS) devices are growing more common and more complex, requiring high-throughput and high-accuracy test solutions.

NI Semiconductor Test System provides high-throughput ATE capabilities that can be combined with handlers with physical stimuli for production test of MEMS sensors and actuators.

This application note explores the following topics:

What is a MEMS device?
Production test of MEMS devices
Overview of the NI Semiconductor Test System (STS)
MEMS handler options with built-in physical stimuli
Other considerations

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Improve MEMS production test throughput and minimize test cost with an integrated, highly parallel ATE solution.

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