Measuring Wafer-Level Reliability Course Overview

Introduction to Wafer-Level Reliability Testing

In this lesson, you are going to explore the purpose of NI’s solution for wafer-level reliability testing and locate the available recourses to assist with integration into a larger test system.

• Challenges of Traditional WLR Systems and Solutions Provided by NI
• Exploring Other WLR Learning Materials

Exploring the Parametric Test System Hardware

In this lesson, you are going to explore the hardware components of the Parametric Test System.

• Exploring the PTS Hardware
• Preparing the Parametric Test System

Exploring the Wafer-Level Reliability Test Software

In this lesson, you are going to explore the software components that are installed as part of the Wafer Level Reliability Test Software.

• WLR Software Overview
• Installing the WLR Test Software
• Exploring the WLR Test Software Components 

Connecting to the DUTs

In this lesson, you are going to learn how to define the wafer, identify the DUTs that you will test on the wafer, and map SMU channels to the DUTs.

• Configuring a Wafer
• Mapping SMU Channels to the DUT
• Preparing Config Files

Performing Compensation

In this lesson, you are going to learn how to compensate SMUs before performing WLR tests to ensure accurate test results.

• What Is Compensation?
• Performing Open and Short Compensation

Performing TDDB Tests

In this lesson, you are going to learn how to use the WLR Test Soft Front Panel to perform a TDDB test and view the results.

• Overview of TDDB Testing
• Performing a TDDB Stress Test

Performing HCI/BTI Tests

In this lesson, you are going to learn how to use the WLR Test Soft Front Panel to perform HCI/BTI tests and view the results.

• Overview of Hot Carrier Injection (HCI) Testing
• Overview of Bias Temperature Instability (BTI) Testing
• Performing HCI/BTI Stress Tests

Configuring Advanced Options for WLR Test Sequences

In this lesson, you are going to explore options for configuring your test sequence to handle a wider variety of WLR test needs.

• Testing a Cassette of Wafers
• Improving the Determinism of Your Measurements
• Improving the Flexibility of Device Mapping 
• Using Current Source Mode

Customizing the Test Execution

In this lesson, you are going to learn how to modify the test flow by adding custom test steps to the test execution.

• Exploring Common Test Execution Customizations

Troubleshooting Common Issues

In this lesson, you are going to learn how to debug and troubleshoot the common issues that arise with system configuration, system operation, and test execution.

• General Troubleshooting Workflow
• Debugging Config File Mapping Errors and Selecting Custom Config Files