Device Testing with Digital Pattern Instruments Course Overview

The Device Testing with Digital Pattern Instruments course enables Test and Validation Engineers to perform characterization and production test of semiconductor devices with digital pattern instruments. The course will focus on how digital pattern instruments and the Digital Pattern Editor can be leveraged to perform common device tests, with a focus on DUT communication, digital interface testing, and continuity and leakage testing. The course will guide the learner through the complete test workflow, from calibration and debugging to extending tests into a test executive.

Course Details:

Device Testing with Digital Pattern Instruments Outline

Creating and Bursting Your First Pattern
Configuring a pin map, level sheet, timing sheet, and pattern file, bursting a digital pattern to the device under test (DUT).
  • PXI Digital Pattern Instruments

  • Key Features of Digital Pattern Instruments

  • Creating and Bursting a Digital Pattern

Creating Pin MapsCreating pin maps in Digital Pattern Editor to define DUT connection sites.
  • Pin Map Overview

  • Creating and Editing Pin Maps

Creating Specifications SheetsStoring values from the data sheet of DUT in specifications sheet variables. 
  • Specifications Sheets

  • Editing Specifications Sheets

Creating Pin Levels SheetsCreating pin levels sheets to define the supply voltages, termination, and logic levels for the DUT.
  • Driving and Comparing Digital Data

  • Termination Modes

  • Pin Levels Sheet

  • Editing Pin Levels with Digital Pattern Editor  

Creating Timing SheetsCreating timing sheets to define the timing characteristics of the interface with the DUT.
  • Timing Sheets

  • Drive Format

  • Drive Edges

  • Compare Strobe 

  • Editing Time Sets

Creating Pattern FilesCreating pattern files to communicate with and test the DUT.
  • Pattern Workflow

  • Converting Existing Working Files

  • Importing Source Files

  • Pattern Basics 

  • Pattern Data

  • Editing Patterns in Grid View

  • Pattern Waveform View

  • Loading and Bursting Patterns  

Programming Digital Pattern in LabVIEWProgrammatically controlling Digital Pattern Instruments using NI-Digital Pattern API.
  • NI-Digital Pattern API Overview
  • Editing Pin Maps with the NI-Digital Pattern API
  • Editing Pin Levels with the NI-Digital Pattern API
  • Editing Time Sets with the NI-Digital Pattern API
  • Loading Files with the NI-Digital Pattern API
Testing DUT Modes of OperationConfiguring the DUT with Serial Peripheral Interface (SPI) commands to test its modes of operations.
  • Exploring SPI Communication
  • SPI Communication with the Example DUT
Performing Register Readback TestsPerforming a register readback test to validate the communication capabilities of the DUT.
  • Introduction to Register Readback Testing
  • Register Readback Testing
Validating DUT TimingInterfacing with external test equipment to validate the DUT timing.
  • Introduction to DUT Timing Validation
  • Validating the timing of the Example DUT
Performing Continuity and Leakage TestingPerforming continuity and leakage tests to validate DUT pin connections.
  • Introduction to Continuity and Leakage Testing
  • Exploring Pin Parametric Measurement Unit (PPMU) Fundamentals



Increasing Pattern Robustness with Flow Control





Increasing the robustness of a pattern by using opcodes to establish flow control.





  • Introducing Opcodes in Digital Pattern Editor
  • Using Repeat and Loop Opcodes in Pattern
  • Exploring Jump and Call Opcodes
  • Using Conditional Behavior
  • Exploring Sequencer Flags and Registers Opcodes





Using Source Waveforms





Using serial and parallel source waveforms to simplify a pattern structure with variable data.





  • Exploring Source Waveforms
  • Configuring Serial Source Waveforms
  • Using Serial Source Waveforms in Patterns 
  • Exploring Source Pin State Replacement 
  • Loading and Unloading Source Waveforms 
  • Configuring Parallel Source Waveforms
  • Using Parallel Source Waveforms in Patterns 
  • Source Bandwidth Considerations





Using Capture Waveforms





Using capture waveforms to store received data for validation and post-processing.





  • Exploring Capture Waveforms
  • Configuring Serial Capture Waveforms
  • Configuring Parallel Capture Waveforms
  • Using Capture Waveforms in Patterns
  • Loading and Unloading Capture Waveforms
  • Capture Waveform Considerations 





Reviewing Test Results with History RAM Report





Using the result of the History RAM report to debug pattern or device under test (DUT).





  • Exploring History RAM
  • Using NI-Digital History RAM API 
  • Memory and Bandwidth Considerations





Viewing Signals with Digital Scope





Using digital scope to view the actual voltage levels on the pins of Digital Pattern Instrument (PXIe-657x).





  • Exploring Digital Scope
  • Configuring and Using Digital Scope





Using Shmoo Plots to Visualize Parameter Relationships








Using Shmoo plots to iterate over pattern parameters and view results.








  • Exploring Shmoo Plots
  • Exploring Shmoo Plot Execution Modes





Synchronizing with Other Instruments





Implementing synchronization strategies such as sharing triggers or using NI-TClk to coordinate tasks with other instruments.





  • Generating Triggers
  • Configuring Start Trigger 
  • Using NI-TClk with Multiple Instruments 
  • Detecting Match or Fail Conditions
  • Synchronization Methods Overview





Wiring and Calibration





Compensating for cable skew and voltage offsets and exploring device calibration requirements.





  • Configuring Time Domain Reflectometry
  • Connecting DUT Ground Sense
  • Calibrating Digital Pattern Devices





Using Opcodes for Scan Testing





Using the scan opcode to divide a vector into one or more scan cycles.





  • Exploring Scan Patterns
  • Using the Scan Opcode in Patterns 



Get started with Device Testing with Digital Pattern Instruments today