Publishes measurement data for one or more pins to the Semiconductor Multi Test step for all sites in the SemiconductorModuleContext.

Syntax

Namespace: NationalInstruments.TestStand.SemiconductorModule.CodeModuleAPI

public void Publish(bool[] data, string publishedDataId="")

Parameters

NameTypeDescription
databool[]

The multisite measurement data from multiple pins connected to multiple instrument sessions. Each element in the array represents a measurement made for a single channel from each instrument session.

publishedDataIdstring

The unique ID for distinguishing the measurement when you publish multiple measurements for the same pins within the same code module. This ID must match one of the values in the Published Data Id column on the Tests tab of the Semiconductor Multi Test step.