TestStand Semiconductor Module Application API: Class Hierarchy
- Updated2025-09-26
- 2 minute(s) read
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TestStand Semiconductor Module Application API
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Class Hierarchy
This inheritance list is sorted roughly, but not completely, alphabetically:
[detail level 12]
| CNationalInstruments.TestStand.SemiconductorModule.IBatchRuntimeData | Contains run-time data for the current batch of parts being tested |
| CNationalInstruments.TestStand.SemiconductorModule.IBinStatistics | Contains the information that describes a bin and the number of parts in the bin |
| CNationalInstruments.TestStand.SemiconductorModule.ICommand | Defines a command or action that an operator interface performs, usually in response to a user clicking a button. Call ISemiconductorModuleManager.GetCommand to obtain a reference to a command |
| CNationalInstruments.TestStand.SemiconductorModule.ICustomizePartAverageTestingCallbackArgs | Contains the argument data that the Semiconductor Module passes to the CustomizePartAverageTesting callback sequence |
| CNationalInstruments.TestStand.SemiconductorModule.IErrorOccurredEventArguments | Provides data for the ISemiconductorModuleManager.ErrorOccurred event |
| CNationalInstruments.TestStand.SemiconductorModule.ILotStatistics | Contains statistical information about the lot |
| CNationalInstruments.TestStand.SemiconductorModule.INumericLimitTest | Contains the settings for a Semiconductor Multi Test NumericLimit test |
| CNationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult | The result of a Semiconductor Multi Test step NumericLimit test |
| CNationalInstruments.TestStand.SemiconductorModule.IObserver | This interface provides a mechanism by which the operator interface monitors events that occur during testing so that it can update the display |
| CNationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingAlgorithmSettings | Provides the standard and custom settings associated with the current PAT algorithm |
| CNationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingCustomizationGroup | Contains a base test and its associated PAT tests. Use the methods and properties on this interface to customize the default PAT tests and to create new custom PAT tests for a specific base test |
| CNationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingEvaluationGroup | Contains a base test result and its associated PAT tests. Use the properties and methods on this interface to evaluate the default PAT tests and the custom PAT tests that you created in the CustomizePartAverageTesting callback sequence |
| CNationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingStaticLimitLoader | Provides a mechanism for loading a standard PAT static limits file |
| CNationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingStaticLimits | Contains the test limits loaded from a static limits file |
| CNationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest | Contains the settings and the results of a PAT test |
| CNationalInstruments.TestStand.SemiconductorModule.IPartCountStatistics | Contains the number of parts in each BinType |
| CNationalInstruments.TestStand.SemiconductorModule.IPerformPartAverageTestingCallbackArgs | Contains the argument data that the Semiconductor Module passes to the PerformPartAverageTesting callback sequence |
| CNationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager | Manages the state and execution for TestStand Semiconductor Module operator interfaces |
| ▼CNationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManagerFactory | Internal interface for TSM. Do not use this interface |
| CNationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerFactory | Factory to create a new instance of the ISemiconductorModuleManager type |
| CNationalInstruments.TestStand.SemiconductorModule.ISetupPartAverageTestingCallbackArgs | Contains the argument data that the Semiconductor Module passes to the SetupPartAverageTesting callback sequence |
| CNationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData | Contains run-time data for a specific test site |
| CNationalInstruments.TestStand.SemiconductorModule.ISoftwareBinStatistics | Contains the information that describes a software bin and the number of parts in the bin |
| CNationalInstruments.TestStand.SemiconductorModule.IWaferRuntimeData | Contains run-time data for the current wafer being tested |
| CNationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerException | The exception thrown when an error occurs in the SemiconductorModuleManager |
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