TestStand Semiconductor Module Application API: NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingEvaluationGroup Interface Reference

Gets one of the custom PAT tests that you created in the CustomizePartAverageTesting callback sequence.

Parameters

partAverageTestId

The unique identifier for the test. Use the same identifier that you used to create the test in the IPartAverageTestingCustomizationGroup.AddCustomLimitComparisonTest or IPartAverageTestingCustomizationGroup.AddCustomLogTest.

Returns

The custom PAT test. You can set properties on the test and call IPartAverageTestingTest.Evaluate to evaluate the test.

The result obtained when the Semiconductor Multi Test step performed the base test. When the Semiconductor Multi Test step performs the base test, it copies the data value for the base test to the data values for all of the PAT tests associated with the base test.

The default test to evaluate for dynamic PAT. This property is null if dynamic PAT is disabled on the base test. You can set properties on the dynamic PAT test and call IPartAverageTestingTest.Evaluate to perform the test.

The default test to evaluate for static PAT. This property is null if static PAT is disabled on the base test. You can set properties on the static PAT test and call IPartAverageTestingTest.Evaluate to perform the test.