TestStand Semiconductor Module Application API: Class Members - Properties
- Updated2025-09-26
- 3 minute(s) read
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TestStand Semiconductor Module Application API
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- a -
- AllSiteLotStatistics : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- AllTestsPassed : NationalInstruments.TestStand.SemiconductorModule.IPerformPartAverageTestingCallbackArgs
- b -
- BaseTest : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingCustomizationGroup
- BaseTestResult : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingEvaluationGroup
- BatchRuntimeData : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- BinDefinitionsFilePath : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- BinName : NationalInstruments.TestStand.SemiconductorModule.IBinStatistics , NationalInstruments.TestStand.SemiconductorModule.ISoftwareBinStatistics
- BinNumber : NationalInstruments.TestStand.SemiconductorModule.IBinStatistics , NationalInstruments.TestStand.SemiconductorModule.ISoftwareBinStatistics
- BinType : NationalInstruments.TestStand.SemiconductorModule.IBinStatistics , NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData , NationalInstruments.TestStand.SemiconductorModule.ISoftwareBinStatistics
- c -
- ConfigureLotWhenStartingLot : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- CoreModelPluginInitializedSuccessfully : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- CurrentCSVTestResultsLogFilePath : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- CurrentLotSummaryReportFilePath : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- CurrentStdfLogFilePath : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- d -
- DataValue : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
- DieCoordinateX : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- DieCoordinateY : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- DisplayDialogOnCodeModuleRuntimeError : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- DynamicPartAverageTestingEnabled : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- DynamicPartAverageTestingHighLimit : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- DynamicPartAverageTestingLowLimit : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- DynamicPartAverageTestingSoftwareBinNumber : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- DynamicPartAverageTestingTest : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingCustomizationGroup , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingEvaluationGroup
- DynamicPartAverageTestingTestName : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- DynamicPartAverageTestingTestNumber : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- e -
- Enabled : NationalInstruments.TestStand.SemiconductorModule.ICommand
- EndLotOnCodeModuleRuntimeError : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- EndOfTestTime : NationalInstruments.TestStand.SemiconductorModule.IBatchRuntimeData , NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- ErrorLogFilePath : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- ErrorMessage : NationalInstruments.TestStand.SemiconductorModule.IErrorOccurredEventArguments
- ExecDescription : NationalInstruments.TestStand.SemiconductorModule.IWaferRuntimeData
- f -
- FabWaferId : NationalInstruments.TestStand.SemiconductorModule.IWaferRuntimeData
- Failed : NationalInstruments.TestStand.SemiconductorModule.IPartCountStatistics
- FrameId : NationalInstruments.TestStand.SemiconductorModule.IWaferRuntimeData
- h -
- HandlerProberDriverData : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- HardwareBinName : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- HardwareBinNumber : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData , NationalInstruments.TestStand.SemiconductorModule.ISoftwareBinStatistics
- HighLimit : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
- HighLimitExpression : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- i -
- InlineQAEnabled : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- InlineQAPartCountStatistics : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- InPerformanceMeasurementSession : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- IsDuplicateDieCoordinates : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- IsDuplicatePartId : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- IsEndingLot : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- IsEndOfWafer : NationalInstruments.TestStand.SemiconductorModule.IBatchRuntimeData
- IsLogOnly : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest , NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
- IsLotComplete : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- IsMeasuringPerformance : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- IsPausingLot : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- IsPerformingSinglePartRetest : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- IsPerformingSinglePartTest : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- IsReadyToTest : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- IsRetesting : NationalInstruments.TestStand.SemiconductorModule.IBatchRuntimeData , NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- IsStartOfWafer : NationalInstruments.TestStand.SemiconductorModule.IBatchRuntimeData
- IsTesting : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- l -
- LastCycleTime : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- LastSocketTime : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- LotEndTime : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- LotEndTimeString : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- LotSettings : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- LotStartTime : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- LotStartTimeString : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- LowLimit : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
- LowLimitExpression : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- m -
- n -
- NumberOfSites : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- NumericFormat : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest , NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
- o -
- OnWafer : NationalInstruments.TestStand.SemiconductorModule.IBatchRuntimeData
- Other : NationalInstruments.TestStand.SemiconductorModule.IPartCountStatistics
- p -
- PartAverageTestingAlgorithmSettings : NationalInstruments.TestStand.SemiconductorModule.ISetupPartAverageTestingCallbackArgs
- PartAverageTestingBaseTestNumber : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- PartAverageTestingCustomizationGroups : NationalInstruments.TestStand.SemiconductorModule.ICustomizePartAverageTestingCallbackArgs
- PartAverageTestingEvaluationGroups : NationalInstruments.TestStand.SemiconductorModule.IPerformPartAverageTestingCallbackArgs
- PartCount : NationalInstruments.TestStand.SemiconductorModule.IBinStatistics , NationalInstruments.TestStand.SemiconductorModule.ISoftwareBinStatistics
- PartCountStatistics : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- PartCountWindowSize : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- PartId : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- PartText : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- Passed : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest , NationalInstruments.TestStand.SemiconductorModule.IPartCountStatistics
- PerformDefaultErrorHandling : NationalInstruments.TestStand.SemiconductorModule.IErrorOccurredEventArguments
- PinMapPath : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- ProductName : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- ProductVersion : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- r -
- Retested : NationalInstruments.TestStand.SemiconductorModule.IPartCountStatistics
- RuntimeProductVersion : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- s -
- ScalingExponent : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest , NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
- SemiconductorModuleManager : NationalInstruments.TestStand.SemiconductorModule.ISetupPartAverageTestingCallbackArgs
- SiteIndex : NationalInstruments.TestStand.SemiconductorModule.ISetupPartAverageTestingCallbackArgs
- SiteNumber : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics , NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- SoftwareBinName : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- SoftwareBinNumber : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest , NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- SoftwareBinNumberExpression : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- StartOfTestTime : NationalInstruments.TestStand.SemiconductorModule.IBatchRuntimeData , NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- StaticLimitLoader : NationalInstruments.TestStand.SemiconductorModule.ISetupPartAverageTestingCallbackArgs
- StaticPartAverageTestingEnabled : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- StaticPartAverageTestingSoftwareBinNumber : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- StaticPartAverageTestingTest : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingCustomizationGroup , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingEvaluationGroup
- StaticPartAverageTestingTestName : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- StaticPartAverageTestingTestNumber : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- StationSettings : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- t -
- TesterStatus : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- TestingState : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- TestName : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest , NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
- TestNameExpression : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- TestNumber : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest , NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
- TestNumberExpression : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest
- TestProgramSequenceFile : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- TestStandErrorCode : NationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerException
- TestTimeInSeconds : NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- Text : NationalInstruments.TestStand.SemiconductorModule.ICommand
- TimeStatisticsWindowSize : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
- TooltipText : NationalInstruments.TestStand.SemiconductorModule.ICommand
- Total : NationalInstruments.TestStand.SemiconductorModule.IPartCountStatistics
- u -
- Units : NationalInstruments.TestStand.SemiconductorModule.INumericLimitTest , NationalInstruments.TestStand.SemiconductorModule.INumericLimitTestResult , NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
- UserDescription : NationalInstruments.TestStand.SemiconductorModule.IWaferRuntimeData
- w -
- WaferAllSiteLotStatistics : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
- WaferId : NationalInstruments.TestStand.SemiconductorModule.IWaferRuntimeData
- WaferRuntimeData : NationalInstruments.TestStand.SemiconductorModule.IBatchRuntimeData
- WillRetest : NationalInstruments.TestStand.SemiconductorModule.IBatchRuntimeData , NationalInstruments.TestStand.SemiconductorModule.ISiteRuntimeData
- WindowPartCountStatistics : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
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