TestStand Semiconductor Module Application API: Class Members - Functions

- a -

• AddCustomLimitComparisonTest() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingCustomizationGroup
• AddCustomLogTest() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingCustomizationGroup

- c -

• CanConfigureHandlerDriver() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• ConfigureHandlerDriver() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• ConfigureLotSettings() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• ConfigureStationSettings() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• CreateObserver() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• CreateSemiconductorModuleManager() : NationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerFactory

- e -

• EndLot() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• Evaluate() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingTest
• Execute() : NationalInstruments.TestStand.SemiconductorModule.ICommand

- g -

• GenerateLotSummaryReport() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetAbsolutePathCustomSettingValue() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingAlgorithmSettings
• GetActualSiteCount() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetAllCSVTestResultsLogFilePathsForLot() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetAllLotSummaryReportFilePathsForLot() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetAllStdfLogFilePathsForLot() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetAverageCycleTime() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetAverageSocketTime() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetBooleanCustomSettingValue() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingAlgorithmSettings
• GetCommand() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetCurrentDebugTestResultsLogFilePath() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetCustomTest() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingEvaluationGroup
• GetExistingSemiconductorModuleManager() : NationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerFactory
• GetHandlerDriverSequenceFilePath() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetHandlerDriverSequenceFilePaths() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetHardwareBinNumbers() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetHardwareBinStatistics() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetHighLimit() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingStaticLimits
• GetInlineQAAlgorithmSequenceFilePaths() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetLowLimit() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingStaticLimits
• GetNumberCustomSettingValue() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingAlgorithmSettings
• GetNumberOfSitesInTestProgramPinMap() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetNumberOfSitesToTest() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetObjectData() : NationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerException
• GetSemiconductorModuleContextIfAtBreakpointForAllExecutions() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetSemiconductorModuleManager() : NationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerFactory
• GetSettingsToDisplay() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetSiteLotStatistics() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetSiteNumbers() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetSiteRuntimeData() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetSitesTesting() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetSoftwareBinNumbers() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetSoftwareBinNumbersByCount() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetSoftwareBinStatistics() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetSpecificationsFilePaths() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetStringCustomSettingValue() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingAlgorithmSettings
• GetTestConditionValueBoolean() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetTestConditionValueNumber() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetTestConditionValueString() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetTesterVelocity() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetTestProgramConfigurationNames() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetTestProgramModelSequenceFilePath() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetTestProgramSequenceFilePaths() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetWaferSiteLotStatistics() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• GetWindowAverageCycleTime() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetWindowAverageSocketTime() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetWindowHardwareBinStatistics() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics
• GetWindowSoftwareBinStatistics() : NationalInstruments.TestStand.SemiconductorModule.ILotStatistics

- i -

• IsTestSocketValidSite() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager

- l -

• LoadStaticLimits() : NationalInstruments.TestStand.SemiconductorModule.IPartAverageTestingStaticLimitLoader

- n -

• NewSemiconductorModuleManager() : NationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerFactory

- p -

• PauseLot() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• PerformSinglePartRetest() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• PerformSinglePartTest() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager

- r -

• ReadLotSettings() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• ReadStationSettings() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• ResumeLot() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager

- s -

• SemiconductorModuleManagerException() : NationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerException
• SemiconductorModuleManagerFactory() : NationalInstruments.TestStand.SemiconductorModule.SemiconductorModuleManagerFactory
• SetNumberOfSitesToTest() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager
• StartLot() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager

- t -

• TestConditionExists() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager

- v -

• ValidateTestProgram() : NationalInstruments.TestStand.SemiconductorModule.ISemiconductorModuleManager