RFmxSpecAnMXAcpMeasurementMethod Enumeration
- Updated2025-10-13
- 2 minute(s) read
Specifies the method for performing the adjacent channel power (ACP) measurement.
Syntax
Namespace: NationalInstruments.RFmx.SpecAnMX
public enum RFmxSpecAnMXAcpMeasurementMethod
Members
| Name | Value | Description |
|---|---|---|
| Normal | 0 | The ACP measurement acquires the spectrum using the same signal analyzer setting across frequency bands. Use this value when measurement speed is desirable over higher dynamic range. |
| DynamicRange | 1 | The ACP measurement acquires the spectrum using the hardware-specific optimizations for different frequency bands. Supported Devices: PXIe-5665, PXIe-5668. |
| SequentialFft | 2 | The ACP measurement acquires I/Q samples specified for a duration by the ACP Sweep Time method. These samples are divided into smaller chunks. The size of each chunk is defined by the SetSequentialFftSize(string, int) method. The overlap between the chunks is defined by the ACP FFT Overlap Mode method. FFT is computed on each of these chunks. The resultant FFTs are averaged to get the spectrum and is used to compute the ACP. Sequential FFT method should be used for the following scenarios.
The following methods have limited support when you set the RFmxSpecAnMXAcpConfiguration.ConfigureMeasurementMethod method to SequentialFft.
Note For multi-span FFT, the averaging count should be 1. |