A test step is an instance of the Semiconductor Multi Test step type or a custom step type based on the Semiconductor Multi Test step type that performs one or more parametric or functional tests. A test step calls a code module implemented in LabVIEW or .NET to control the instrumentation on the tester, take measurements from the DUT, and pass measurement values back to the Semiconductor Multi Test step. The step performs parametric and functional tests using the measurement values obtained from the code module. The Main sequence of a test program sequence file defines the test steps to execute and the order in which to execute them. You can use standard TestStand control flow features, such as preconditions and Flow Control step types, to control the test flow.

To skip subsequent tests when a test fails, enable the Stop Performing Tests after First Failure option on the Options tab of the Semiconductor Multi Test step in the sequence editor and also set the On Step Failure sequence option to Goto Cleanup on the General tab in the Sequence Properties dialog box. To skip one or more tests based on specific conditions, use the Get Test Information step to save the condition in a local variable and use an expression that refers to the variable in a precondition expression or in the condition expression of an If step. Skipping a test step execution skips all tests associated with the test step.

Note You cannot use multiple Semiconductor Multi Test steps or Semiconductor Action steps configured to use multiple threads in While loops, in Do While loops, or in For loops that use the Custom Loop option when performing multisite testing. The steps report a run-time error in these situations. Use other types of loops instead, such as For loops that use the Fixed Number of Iterations option.

Programming Multiple Test Flows in a Test Program

You can execute multiple test flows from a single test program. A test program can contain multiple configurations to specify values for test conditions that can control execution flow. Use the Test Program Editor to specify configurations and test condition values for a test program.

TSM sets available test configurations when you configure a lot for execution. You can use the values of test conditions to control the flow of the sequence when used as inputs to TestStand Flow Control step types. Use the Get Test Information step type to obtain the value of a test condition at run time. You can specify the TestFlowId standard lot setting as a standard test condition that identifies the test flow in an STDF log file.

Performing Tasks after all Tests Complete

TSM assigns a bin to the DUT after the MainSequence sequence executes. Therefore, if you need to perform tasks after TSM has assigned a bin to the DUT, you must perform these tasks in the OnSiteTestingComplete callback sequence. If not, you can perform them in the Cleanup step group of the MainSequence sequence. If you do use the Cleanup step group for these tasks and your test program uses part average testing, you should precede the tasks with a Perform Part Average Testing step, so that you can ensure that they run after all part average testing is completed. If you don't use a Perform Part Average Testing step, TSM performs part average testing after executing all step groups of the MainSequence sequence.

to perform tasks after all tests have completed because TSM performs the part average testing after the MainSequence sequence executes.

TSM assigns a bin to the DUT after the MainSequence sequence executes and after performing part average testing tests. Regardless of whether the test program uses part average testing, to perform a task that requires access to the bin assigned to the DUT, you must use the OnSiteTestingComplete callback sequence.

In general, do not use the PostUUT Model callback because TestStand calls this callback after TSM sends the end-of-test (EOT) notification to the handler or prober. As a result, you cannot perform operations on a DUT in the PostUUT callback.