The following figure shows how to source zero volts on all digital pins and then for each digital pin, source a voltage, wait, and measure.



This example includes the following main tasks:

  1. Query for the sessions for all test pins.
  2. Use a parallel For Loop to iterate on every instrument you need to call to source zero volts on all pins.
  3. Use a For Loop to iterate on every digital I/O pin.
  4. For each pin, query for the session for the pin under test.
  5. Use a parallel For Loop to iterate on every instrument you need to call to source a voltage, wait, and take a measurement on the pin under test.
  6. Use the Pin Query Context for the pin under test with a pin-based instance of the Publish Data VI to publish the data for each pin.

The Semiconductor Multi Test step that calls the code module shown above contains the following tests, where each test evaluates one measurement for each pin, as shown in the following figure: