The following figure shows how to take a parametric measurement on one or multiple pins.



This example includes the following main tasks:

  1. Query for the sessions for the pin(s) you want to measure.
  2. Use a parallel For Loop to iterate on every instrument you need to call to take the multisite measurement.
  3. Use the Pin Query Context with a pin-based instance of the Publish Data VI to publish the measurement.
  4. Query for a measurement value for a specific pin and site combination. The source code for the query is in the Query Pin Site Data VI.

The Semiconductor Multi Test step that calls the code module shown above contains the following tests, where each test evaluates one measurement for each pin, as shown in the following figure: