The following figure shows how to use the NI-HSDIO hardware compare engine for a multisite functional test.



This example includes the following main tasks:

  1. Query for the sessions for the digital I/O pins under test.
  2. Use a parallel For Loop to iterate on every required instrument to start digital hardware compare and to obtain the cumulative error masks.
  3. Use the Pin Query Context to obtain the digital per-instrument, per-site channel masks.
  4. Compare the per-instrument error masks to the per-site, per-instruments masks to identify sites that failed.
  5. Query for measurement data for sites that failed. The source code for the query is in the Failure Pin Site Data VI.
  6. Use the Publish Data VI to publish per-site Boolean results.

The Semiconductor Multi Test step that calls the code module shown above contains the following test, which evaluates one Boolean result, as shown in the following figure: