Logging Failed Cycle Information from NI-Digital Pattern Driver to STDF Log File (TSM)
- Mise à jour2025-07-31
- Temps de lecture : 1 minute(s)
You can fetch and publish failed cycle information from the NI-Digital Pattern Driver and log the information in the STDF Log file.
Note TSM does not support logging failed cycles when using multiple NI-Digital Pattern Driver sessions to burst a pattern for a site. If you need multiple instruments to burst a pattern for a site, combine those instruments into a group in the pin map so the test program uses a single session to burst the pattern.
Contenu associé
- Fetching and Publishing Failed Cycle Information in LabVIEW Code Modules (TSM)
Fetch and publish failed cycle information from an NI-Digital Pattern Driver with your LabVIEW application.
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