NIHSDIO_ATTR_DATA_ACTIVE_EVENT_POSITION
- Updated2023-02-21
- 1 minute(s) read
Specific Attribute
| Data type |
Access | Applies to | Coercion | High-Level Functions |
|---|---|---|---|---|
| ViInt32 | R/W | N/A | None | None |
Description
Specifies the position of the Data Active event relative to the Sample clock. Event voltages and positions are only relevant if the destination of the event is a front panel connector.
Defined Values:
| NIHSDIO_VAL_SAMPLE_CLOCK_RISING_EDGE (18) | The event is issued synchronously with the Sample clock rising edge. |
| NIHSDIO_VAL_SAMPLE_CLOCK_FALLING_EDGE (19) | The event is issued synchronously with the Sample clock falling edge. |
| NIHSDIO_VAL_DELAY_FROM_SAMPLE_CLOCK_RISING_EDGE (20) | The event is issued synchronously with delay from rising edge of the Sample clock. Specify the delay using NIHSDIO_ATTR_DATA_POSITION_DELAY. This choice has more jitter than the rising or falling edge values. Certain devices have Sample clock frequency limitations on when a custom delay can be used. Refer to the device documentation for details. |