Fetch History RAM Cycle Information (2D Pin States)

Returns the acquired pattern information for the specified cycles. Use this node if the pattern is using the edge multiplier feature.

Cycle numbers represent tester cycles, each of which may consist of multiple DUT cycles. When using pins with mixed edge multipliers, pins may return Not a pin state for DUT cycles where those pins do not have edges defined.

Inputs/Outputs

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pin list

List of pins from which to collect the History RAM cycle information.

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session in

Instrument session obtained from the niDigital Initialize with Optionsnode.

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site

Site specified as a string in the form of siteN, where N is the site number. The node returns an error if more than one site is specified.

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samples to read

Number of samples to fetch.

A value of -1 specifies to fetch all available samples.
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error in

Error conditions that occur before this node runs.

The node responds to this input according to standard error behavior.

Standard Error Behavior

Default value: No error

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position

The sample index from which to start fetching pattern information.

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session out

Handle that identifies the session in all subsequent NI-Digital node calls.

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cycle information

The returned History RAM cycle information.

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error out

Error information.

The node produces this output according to standard error behavior.

Standard Error Behavior