Limit Testing Time VI
- Updated2025-07-30
- 6 minute(s) read
Performs limit testing on waveform or cluster input data. The VI compares signal in with upper limit and lower limit and ignores any limit input that is not wired. You can wire output values to a graph to view the limits, signal, and failures. Wire data to the signal in input to determine the polymorphic instance to use or manually select the instance.

Inputs/Outputs
output t0
—
output t0 determines the source of start time, t0, of the waveforms for output values.
signal in
—
signal in specifies the waveform to test to make sure it lies in the envelope bounded by the upper and lower limits.
upper limit
—
upper limit specifies the upper boundary of the envelope. The default is Inf.
lower limit
—
lower limit specifies the lower boundary of the envelope. The default is –Inf.
error in (no error)
—
error in describes error conditions that occur before this node runs. This input provides standard error in functionality.
limit test config
—
limit test config specifies the limit-test pass region and whether the limit values are included.
failures
—
failures returns the locations of failed test points.
test passed?
—
test passed? indicates the result of limit mask testing. If TRUE, the signal is less than or equal to upper limit and greater than or equal to lower limit and the limit testing passed. If FALSE, the limit testing did not pass.
test results
—
test results returns the results of the limit testing at each data point. The VI returns TRUE if the data point is less than or equal to upper limit and greater than or equal to lower limit.
output values
—
output values contains the upper limit and lower limit, the signal, and the failures. You can wire this output to a graph to view the values. The first element in the array is the input signal. The x0 and dx values in this waveform are changed so that it can be easily plotted with the upper and lower limits. The second element in the array is the failure waveform. The failure waveform contains NaN at points where the limit test passes and contains the input signal where the limit test fails. The third and fourth elements of the array are the upper and lower boundaries, respectively.
error out
—
error out contains error information. This output provides standard error out functionality.
clearance
—
clearance returns distance measures between signal in and upper limit and lower limit.
|
Examples
Refer to the following example files included with LabVIEW.
- labview\examples\Signal Processing\Waveform Measurements\Limit Testing Measurement.vi
- labview\examples\Signal Processing\Waveform Measurements\Limit Testing for Unevenly Sampled Data.vi
output t0
—
signal in
—
upper limit
—
x0
—
Y
—
error in (no error)
—
pass region
—
include UL
—
failures
—
x values
—
test passed?
—
test results
—
output values
—
error out
—
clearance
—
clearance UL
—