From Friday, April 19th (11:00 PM CDT) through Saturday, April 20th (2:00 PM CDT), 2024, ni.com will undergo system upgrades that may result in temporary service interruption.
We appreciate your patience as we improve our online experience.
From Friday, April 19th (11:00 PM CDT) through Saturday, April 20th (2:00 PM CDT), 2024, ni.com will undergo system upgrades that may result in temporary service interruption.
We appreciate your patience as we improve our online experience.
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Measuring Wafer-Level Reliability Course 將介紹晶圓級穩定性 (WLR) 測試，以及如何將 PXI 電源量測單元 (SMU) 和受測裝置 (DUT) 等硬體與 WLR Test Software 整合。本課程幫助您了解如何使用 WLR Test Software 執行 2 端子和 4 端子壓力測試和參數掃描，以量測半導體晶圓的穩定性。在執行 WLR 測試並將 SMU 通道映射到 DUT 之前，您將學習補償 SMU。此外，該課程還教您如何執行與時間相關的閘道極氧擊穿 (TDDB) 和偏壓溫度不穩定性/熱載流子注入 (BTI/HCI) 測試。您還將學習如何解決系統配置、系統操作和測試執行中出現的常見問題。Measuring Wafer-Level Reliability Course 推薦給需要現成軟體解決方案，來測試其半導體晶圓可靠性的測試工程師。
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