Passive and active electronically scanned arrays (ESAs) play a critical role in harnessing and defending the electromagnetic spectrum in modern radar and SATCOM applications. Mission success revolves around the characterization and production test of the RF and microwave semiconductor components within these systems. Technological innovations in this area are creating significant design and test challenges, including:
Leverage NI’s modular platform to develop test systems that meet your high-mix, low-volume needs
Reduce capital cost substantially using high-performance test equipment versus traditional instruments
Capture better data faster and run multiple test cases simultaneously with NI’s leading measurement speed and quality
NI提供了各种集成解决方案可供选择,满足您特定应用的需求。您可以将系统集成工作完全交给公司内部的集成团队,也可寻求NI以及遍布全球的NI合作伙伴的帮助,获取完整的系统解决方案。
NI合作伙伴网络是一个由领域专家、应用专家和整体测试开发专家组成的全球社区,与NI紧密合作,全力满足工程界的需求。NI合作伙伴包含了解决方案提供商、系统集成商、顾问、产品开发人员以及服务和销售渠道专家,他们在诸多行业和应用领域都有着丰富的经验,值得您信赖。
NI partners with you throughout the life cycle of your application by delivering training, technical support, consultation and integration services, and maintenance programs. Accelerate your learning with our company-specific and geographic user groups. Build proficiency with online and in-person training options.
Discover how the ESA Characterization Reference Architecture can help you validate and test the latest generation of ESA components, modules, and sub-assemblies for radar, EW, and SATCOM with a modular approach to developing test systems that scales to meet high-mix, low-volume test requirements.
NI合作伙伴(NI Partner)是独立于NI的商业实体,与NI之间不存在代理、合伙或合资关系。