Reduce Risk for RF and Microwave Semiconductor Component and Module Test

Passive and active electronically scanned arrays (ESAs) play a critical role in harnessing and defending the electromagnetic spectrum in modern radar and SATCOM applications. Mission success revolves around the characterization and production test of the RF and microwave semiconductor components within these systems. Technological innovations in this area are creating significant design and test challenges, including:

 

  • More efficient high-power RF devices based on modern GaN process technologies

  • Increasingly complex RF components and modules with progressively wider bandwidths

  • Multichannel RF front ends to handle frequency agile and multiband applications

  • More RF channel and high-speed digital I/O integration
  • Software defined digital processing capabilities to meet multifunction application needs

 

Electronically Scanned Array (ESA) Parametric Characterization and Production Test Solution

  • Wide coverage of DC, RF, and digital interface needs for mixed-I/O testing applications.
  • Easy-to-use synchronization and triggering between multiple instruments.
  • RF instrumentation optimized for wideband performance and digital signal processing.
  • Multichannel RF system performance with tight subnanosecond time alignment and adjustable phase coherency in the RF domain.
  • Unified software for developing, debugging, and deploying test systems and applications.
  • FPGA coprocessing options and high-speed data movement for expanding test needs, from component and module level test to functional validation of subassemblies and systems.

Solution Advantages

  • Leverage NI’s modular platform to develop test systems that meet your high-mix, low-volume needs

  • Reduce capital cost substantially using high-performance test equipment versus traditional instruments

  • Capture better data faster and run multiple test cases simultaneously with NI's leading measurement speed and quality

Build Your Solution with the NI Ecosystem

NI提供了各种集成解决方案可供选择，满足您特定应用的需求。​您可以将系统集成工作完全交给公司内部的集成团队，也可寻求NI以及遍布全球的NI合作伙伴的帮助，获取完整的系统解决方案。

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Services and Support

NI partners with you throughout the life cycle of your application by delivering training, technical support, consultation and integration services, and maintenance programs. Accelerate your learning with our company-specific and geographic user groups. Build proficiency with online and in-person training options.

Talk to a Technical Expert to Learn More about RF and Microwave Semiconductor Component and Module Test

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