RFIC Testing from R&D to Production: Choosing a test approach to reduce the cost of test

Publish Date: Dec 2, 2015 | 0 Ratings | 0.00 out of 5 | Submit your Review

Overview

With the explosion of wireless technology, engineers are increasingly required to transition RFIC's from R&D to production test more quickly - and at a lower cost. In this session we will review some of the key technologies required for testing RFICs in R&D - such as envelope tracking (ET) and digital predistortion (DPD).  In addition, we will introduce new features of the NI Semiconductor Test System that are used for production test cell integration.


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