An Architecture for EO/IR Test Systems

Publish Date: May 19, 2016 | 0 Ratings | 0.00 out of 5 | Submit your Review


Since architecting to achieve desirable features (such as modularity or scalability) in a deliverable product is a prime enabler of affordability, we assert that architecting to achieve the same features in enabling products (i.e. test systems) is critical to achieving further cost efficiencies. The presentation describes an architecture developed for EO/IR test systems and highlights the modularity and re-use embedded in the architecture which provide for what is, in essence, a product platform of enabling products.

Featured Presenter: Tom Brozenec, Ph.D., Engineering Fellow – Raytheon Space and Airborne Systems

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