Learn strategies for reducing cost of test at the fifth-annual Automated Test Summit. Leading test and measurement companies worldwide are taking part in this virtual industry event, hosted by National Instruments, to share their tips and best practices. By participating in this online event, you can experience the presentations, exhibitors, and dynamic atmosphere of a traditional conference - all from the convenience of your desk.

• Completely online
• Free to view
• Keynotes and technical sessions
• Virtual exhibitors' booths with technical resources

Virtual Online Event - Access this conference from the convenience of your computer.
View the June 5th, 2008 Event

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Conference Schedule

Keynote: Five Trends in Automated Test
Mike Santori, Technology and Business Fellow, National Instruments

Regional Keynote: Addressing the Challenge of Multicore Programming (Americas and Asia)
Jim St. Leger, Technical Marketing Manager, Intel
John Pasquarette, Director of Software Marketing, National Instruments

Regional Keynote: Ideal Test Systems for the Automotive Industry (Europe)
Matthias Krause, President, CGS Automotive, Inc

Session Themes Include:
Reducing Software Development Cost
The Latest Trends in Hardware Design
Extending the Life of Your Test System
Test Engineering Panel Discussion

View the Full Agenda

See what you missed at the Automated Test Summit 2007

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