The PXI-based NI Semiconductor Test System (STS) combines modular instrumentation and system design software for RF and mixed-signal production test.
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
See how STS makes it easy to integrate NI PXI into a semiconductor production test environment.
IDT not only reduced its cost of test with STS but also has the flexibility to grow its test coverage to meet emerging test requirements.
Learn about STS features for RF power amplifiers, RF front-end modules, and more.