Hardware-in-the-Loop (HIL) Simulation

Real-world testing of the embedded control systems found in vehicles can be complex, expensive, and hazardous. HIL simulation lets engineers thoroughly and efficiently test embedded devices in a virtual environment.

NI Expertise Overview

Vehicle engines today are extremely complex because of their many subsystems, each with a controller to manage fuel injection, emissions, engine noise, and more. This complexity makes the job challenging for engineers with short development cycles and pressure to limit costs. Using HIL simulation, you can replicate specific parts of the embedded system and test them in a virtual environment before running real-world diagnostics on the complete system. NI’s HIL solutions are open and flexible and give engineers the ability to make customizations to fit their specific needs. Using a modular architecture, engineers can easily upgrade the platform with added functionality. This way they can future proof their test systems and meet the requirements of the most demanding embedded software test applications. Compared to competitors, NI's performance capabilities make it the best option for testing innovative control systems.

Featured Content

TATA Motors built a reliable, and adaptable HIL test system using NI modular hardware and extensible software.
The NI Electric Motor Simulation Toolkit provides high-performance models for hardware-in-the-loop testing.
National Instruments HIL test webcast series

Products and Solutions

The NI Alliance Partner Network

The Alliance Partner Network includes more than 950 companies that specialize in complete solutions. From products and systems to integration, consulting, and training services, NI Alliance Partners are uniquely equipped and skilled to help solve some of the toughest engineering challenges.

Application Resource Kit

Hardware-in-the-Loop Resource Kit

This resource kit includes technical tutorials for HIL applications. Learn more about HIL test system architectures, selecting HIL test system I/O interfaces, and using fault insertion units for electronic testing.