Wafer-level test engineers need to reduce test time without sacrificing measurement quality and accuracy.
A Smarter Approach to Wafer-Level Parametric Test
As IC manufacturers continue to introduce new and innovative processes with decreasing device geometries, they need to ensure the additional complexity from these changes does not affect the long-term reliability of their ICs. As technologies evolve at a rapid pace, semiconductor manufacturers must increase the amount of reliability data they collect and analyze while decreasing the cost of test. When faced with this problem of more data at a lower cost, many reliability engineers find they cannot solve it using traditional reliability solutions, so they are turning toward modular, flexible solutions that can scale to fit their needs.
This application software helps test and validation engineers quickly build and deploy automated test systems.
The NI Alliance Partner Network
The Alliance Partner Network includes more than 1,000 companies that specialize in complete solutions. From products and systems to integration, consulting, and training services, NI Alliance Partners are uniquely equipped and skilled to help solve some of the toughest engineering challenges.