RF and Wireless Summit

Experience the NIWeek RF and Wireless Summit and Pavilion

Experience the NIWeek RF and Wireless Summit held on Tuesday and Wednesday, August 6 and 7 and visit the RF and Wireless Pavilion located on the Exhibit Floor.

Register Today

RF and Wireless Summit

Learn how National Instruments is redefining RF and wireless test. Hear from RF, microwave, and wireless industry experts as they explain the latest trends, emerging technologies, and test techniques at the RF and Wireless Test Summit. Technologies discussed will include Software-designed Instrument, FPGA signal processing, MIMO, advanced network analysis, microwave system simulation, and microwave frequency synthesis.

Who Should Attend

Engineers, Scientists, Researchers, Professors, Industry Experts, Test Managers, and Students

2013 Keynotes

Challenges of RF Test in HVM

A discussion on the challenges of bringing RF test to high volume test solutions. The cost of testing mobile device SOC/SIP's is driving hard choices in production testing. Zero test time or zero capital equipment or infinite parallelism; each corner drives complexity and compromises in the test platform. As SOC/SIP devices drive complexity up, traditional HVM methods and equipment are challenged from both capability and cost point of view.

The Massively Broadband® Wireless Future

The millimeter-wave spectrum above the 10 GHz frequency band has yet to be tapped by wireless mobile networks. But advances in CMOS semiconductor technologies and recent communication system research show that mobile wireless communication networks may soon be able to use this spectrum to offer thousands of times greater data rates than today's 4G LTE cellular systems. Examine key technological breakthroughs, future system architectures, and the research challenges of a new era in wireless featuring multigigabit-per-second data rates.

2013 Technical Sessions