数字万用表、电子负载、示波器、源测量单元和波形发生器等电子测试仪器是自动化测试系统的基础。这些产品适用于工程师在验证、确认和生产阶段测量、监控、调试和分析设备和组件。
电子测试仪器在整个产品生命周期中至关重要。它们在下列应用中起着关键作用:
NI还提供其他硬件来完成基于计算机的测试和测量系统,包括DMM和示波器等PXI仪器、RF硬件以及通信总线和协议接口。
NI软件可释放仪器硬件的全部潜能,实现配置、控制、自动化、数据分析或部署及监控。这些资源可帮助用户选择与要完成的任务最匹配的软件。
Electronic test instruments generate or receive signals to help measure and analyze the performance of electronic components and devices. Common test instruments include multimeters, oscilloscopes, digitizers, source measure units, and waveform generators.
Digital instruments convert an analog signal into a numerical value for processing and display results on a screen. Digital test instruments offer various benefits, including taking extremely precise measurements that can be imported into software programs for analysis.
Analog test instruments measure continuously varying signals and display results through physical movement, such as a needle sweeping across a gauge to show voltage. While still common in consumer devices, digital instruments are generally preferred for automated testing due to their higher precision, easier data logging, and integration with software.
NI electronic test instruments provide precise, real-time measurements and are designed for easy incorporation into existing automated test systems. Their modular design allows for flexible customization, and they work well with third-party hardware. Straightforward integration with test and measurement software and extensive training and support resources simplify automated testing across industries, including the semiconductor, automotive, and aerospace sectors.
Modular instruments are measurement and test instruments built as plug‑in modules. Instead of each instrument having its own stand-alone box, modular instruments share power, timing, triggering, and data communication through the chassis backplane. This architecture lets engineers mix and match instrument types, scale channel counts, synchronize multiple modules with sub‑nanosecond precision, and create flexible, software‑defined test systems for automated testing, validation, and high‑performance measurement applications.
NI示波器和数字化仪属于精密模块化仪器,用于在自动化测试和高通道数系统中采集和分析电信号。示波器提供交互式实时可视化和测量,是调试和设计验证的理想选择,而数字化仪则提供高速、深存储数据采集,通过软件控制和完全用户可编程FPGA进行高级分析和长时间记录。
数字万用表可执行高精度电压、电流、电阻、温度、电感、电容和频率/周期测量以及二极管测试。某些DMM具有用于捕捉和分析波形的隔离数字化仪模式。数字万用表适用于从验证到生产的各种应用。
NI LCR仪表测量电子元件的电感(L)、电容(C)和电阻(R)。它们向被测设备应用交流信号并分析响应以确定这些值。LCR仪表对于评估无源组件并确保其符合设计规范至关重要。
NI电源为待测设备(DUT)提供精确、可编程的直流电压和电流,确保可重复的安全操作。它们支持动态供电、排序和软件定义控制等高级功能。通过集成至自动化测试系统的灵活配置,工程师和技术人员能够模拟真实情况、验证设计并确保可靠的设备性能。
电子负载从待测设备(DUT)吸收电流,以模拟电池、电源、燃料电池、太阳能电池板和其他电子设备的实际性能。这些可编程测试仪器以恒流、恒压、恒阻和恒功率等模式运行,以满足各种测试需求。电子负载有助于验证性能和解决电气问题,是自动化测试系统的常见组件。
NI数字I/O产品可在TTL、CMOS和24 V等多个逻辑电平采集并生成数字信号和模式。从而实现电路特性分析、设备控制和灵活的自动化。NI DIO应用于测试、测量、工业控制和原型验证领域,可与NI软件集成,实现配置、自动化和高级数据分析。
NI频率计数器硬件测量信号特性,包括频率、周期、时间间隔、相位等。
NI FlexRIO仪器结合了用户可编程FPGA和高性能I/O,可创建专用仪器。工程师可在软件中实现自定义数字逻辑、定时和协议处理,从而加快PXI或PCIe系统中的验证、仿真和高吞吐率测试。
开关是用于在仪器和待测设备(DUT)之间路由传输电信号的硬件组件。对于自动化连接、扩展测量范围和提高吞吐量(无需手动重新布线)至关重要;它们对于构建高效、可扩展的自动化测试系统至关重要。