使用​PXI​模​块​化​仪器​完成​超低​功耗​ASIC​设计​的​结构​和​内存​测试

Mario Konijnenburg, Holst Centre/​imec

"我们​已​使用​PXI Express​自动​测试​系统​完成​多个​项目,​并​获得​非常​满意​的​效果。​自动​测试​系统​大大​减少​了​芯​片​测试​的​时间,​而​其​快速、​准确​的​直流​测试​更是​实验​室​的​宝贵​财富。" ​

- Mario Konijnenburg, Holst Centre/​imec

挑战:

创建​灵活​的​测试​系统​用于​自动​验证​和​表征​新的​超低​功耗​半导体​芯​片​设计。 ​

解决​方案:

使用​NI LabVIEW​软件​和​NI PXI Express​高速​数字​I/​O​设备​开发​自动​测试​系统,​前者​读​取​测试​向量,​后者​产生​和​接收​数字​数据,​并​同时​以​很高​的​精度​测量​芯​片​设计​的​直流​损耗。 ​

​ ​Test Bench With PXI Express Tester Interfacing With an Experimental Chip ​
​ ​We use a PXI-4071 to measure and record µA currents during memory write (first incline) and memory read (second incline) operations of an experimental new design of a memory chip. ​
​ ​This is the main structural test program. Several .csv files with binary test and simulation vectors can be loaded and output sequentially. The application can also indicate possible errors between simulated and real acquired digital data. ​
​ ​Wireless system on chip ​