Measuring Wafer-Level Reliability Course Overview

The Measuring Wafer-Level Reliability course teaches you the basics of measuring the reliability of semiconductor wafers with the Wafer Level Reliability Test Software.

 

Course Last Release Date or Version Number: 21.5

Course Details:

Measuring Wafer-Level Reliability Course Overview Outline

Lesson Overview Topics

Introduction to Wafer-Level Reliability Testing

In this lesson, you are going to explore the purpose of NI’s solution for wafer-level reliability testing and locate the available recourses to assist with integration into a larger test system.

  • Challenges of Traditional WLR Systems and Solutions Provided by NI
  • Exploring Other WLR Learning Materials

Integrating Hardware for WLR Testing

In this lesson, you are going to explore the hardware requirements for performing wafer-level reliability testing with the WLR Test Software.

  • Exploring WLR Test Hardware
  • Connecting to the DUT

Exploring the Wafer-Level Reliability Test Software

In this lesson, you are going to explore the software components

  • Installing the WLR Test Software
  • Exploring the WLR Test Software Components

Mapping WLR Hardware to DUT Pins

In this lesson, you are going to learn how to configure the mapping between SMU channels, pins on your probe card, and DUTs on the wafer.

  • Mapping SMU Channels to the DUT0
  • Preparing Configuration Files

Performing Compensation

In this lesson, you are going to learn how to compensate SMUs before performing WLR tests to ensure accurate test results.

  • What Is Compensation?
  • Performing Open and Short Compensation

Performing TDDB Tests

In this lesson, you are going to learn how to use the WLR Test Soft Front Panel to perform a TDDB test and view the results.

  • Overview of TDDB Testing
  • Performing a TDDB Stress Test

Performing HCI/BTI Tests

In this lesson, you are going to learn how to use the WLR Test Soft Front Panel to perform HCI/BTI tests and view the results.

  • Overview of HCI and BTI Tests
  • Performing HCI Tests
  • Performing BTI Tests

Customizing the Test Execution

In this lesson, you are going to learn how to modify the test flow by adding test steps to customize internal system configuration settings.

  • Common Test Execution Customizations
  • Modifying Internal System Configuration Settings
  • Changing DC Power Parameters

Troubleshooting Common Issues

In this lesson, you are going to learn how to debug and troubleshoot the common issues that arise with system configuration, system operation, and test execution.

  • General Troubleshooting Workflow
  • Debugging Configuration File Mapping Errors
  • Selecting Custom Configuration Files

Get started with Measuring Wafer-Level Reliability today