TestStand 2016 SP1 Semiconductor Module Bug Fixes


This document contains the TestStand Semiconductor Module Bug Fixes that were discovered before and since the release of NI TestStand 2016 SP1 Semiconductor Module. Not every bug fix known to NI will appear on this list; it is intended to only show the severe and more common issues that have been addressed.


Contacting NI

Feel free to contact NI regarding this document or issues in the document. If you are contacting NI in regards to a specific issue, be sure to reference the ID number given in the document to the NI representative. The ID number contains the current issue ID number as well as the legacy ID number (use the current ID number when contacting National Instruments). You can contact us through any of the normal support channels including phone, email, or the discussion forums. Visit the NI Website to contact us. 

Bug Fixes

The following items are Bug Fixes in NI TestStand 2016 SP1 Semiconductor Module.

ID Fixed Issue Issue Details
557654 Importing limits from a test limits file that changes the evaluation type of a test might not correctly set the flags on the test properties If you import test limits into a sequence file with the Update limits in matching tests option enabled and the import operation changes the Evaluation Type of an existing test, certain flags on the test properties are set incorrectly. These flags do not affect execution of the test program because the Semiconductor Multi Test step corrects the settings at run time. The specific flag involved is the Dont Copy To Results flag on the NumericLimit or PassFail properties.
590475 You must restart the computer to install the TestStand Semiconductor Module after you install TestStand, which prevents silent installs

The TestStand Semiconductor Module relies on a reboot of the computer after you install TestStand. If you do not restart the computer, a modal dialog box returns the following error: 
The TestStand Service did not start up promptly.The TestStand Engine uses this service to ensure that external environments such as LabVIEW, LabWindows/CVI, and Microsoft Visual Studio are properly updated. The TestStand Service can sometimes be delayed after restarting a system if a previous service is slow to start. For example, the Windows Workstation service can delay for a few minutes on startup when trying to reconnect to mapped network drives if the drives are not immediately available. Determine the offending service and see if you can resolve why it is slow to start. An option is to mark the service as manual, and delay the launching of it by adding a command to the startup group to start the service. 
Because a modal dialog box returns the error, a silent installation (including an installer running in silent mode that you build with the Batch Installer Builder) cannot complete successfully.

596546 Cycle and socket times might temporarily increase after you click inside the Bin Summary Table of the LabVIEW operator interface while executing a lot Clicking inside the Bin Summary Table of the TestStand Semiconductor Module LabVIEW operator interface while executing a lot might result in temporarily increased cycle and socket times. The overall performance degradation is more pronounced with higher site counts.
598494 Some legacy digital example LabVIEW VIs are not saved in the correct version of LabVIEW The following VIs are saved in LabVIEW 2014 instead of in LabVIEW 2013:
  1. Turn On Power to DUT.vi
  2. Trim Vref Value.vi
  3. Reset Power Supply to Vcc_Typical.vi
  4. Measure Vref.vi
  5. Leakage.vi
  6. Initiate Waveform and Get Results.vi
  7. Idle Power Consumption.vi
  8. Continuity.vi
  9. Check part number register with multiple Vcc values.vi
600508 The TestStand Semiconductor Module fails to call the LabVIEW event callback for the ErrorOccurred event LabVIEW operator interfaces can use the SemiconductorModuleManager object to register an event callback for the ErrorOccurred event. Although the Semiconductor Module should call the event callback when a run-time error occurs during testing, it fails to do so. Even if the error event is not properly raised, parts are correctly binned to the default error bin as defined by in the bin definitions file.
605735 Disabling result recording returns an error When you set the option in the Station Options dialog box to disable result recording for all sequences, you might receive an "Object reference not set to an instance of an object" error message.
608349 Test Results Log and STDF log contain duplicate test results for steps that use looping in TestStand For a step in TestStand that loops N times, N+1 results are generated. The Test Results Log and STDF result processors treat the 0th and Nth result the same and duplicate the information in the log files.
608675 Incorrect configuration definition causes Error -17101 If you define test condition but do not define a test configuration, the Lot Settings dialog box returns an error when it attempts to load the current value of the test conditions to populate the corresponding fields in the dialog box.
613643 Pin map does not support correctly specifying RFPM port number range The RF subsystem definition assumes continuous range of ports. It is not possible to limit the range of supported ports appropriately in the pin map for an RF subsystem. The hardware does not physically support the options available in the 'Connections' section of the pin map.
626657 Set Site Data VI incorrectly stores site data when called from a code module that executes on all sites and the site numbers are not in numeric order If a code module executes on all sites because the subsystem includes all sites or because the "One thread only" setting is enabled and the sites in the Semiconductor Module context are not in numerical order, the Set Site Data VI stores the site data incorrectly.
627973 Running TestStand Version Selector improperly registers 32-bit TestStand Semiconductor Module (TSM) type libraries Running the TestStand Version Selector to make TestStand 2016 active when 32-bit TSM 2016 is installed improperly registers 32-bit TestStand Semiconductor Module (TSM) type libraries, and the type libraries no longer include references to the TestStand type libraries. This situation causes various TestStand types used in the TSM Application API to change from SequenceFile Object References to Object References, which result in broken VIs in the TSM operator interfaces because the associated references turned into variants in LabVIEW.
634125 Exporting limits for a Pass/Fail test exports the value "LOG&qout for the Comparison Type column The Comparison Type column is not used for Pass/Fail tests and should export a blank value.
641153 Undo/redo on Options tab changes focus to the Properties tab for Step Settings If you undo or redo a change on the Options tab of the Step Settings of a step, the focus switches back to the Properties tab.
643064 Importing Test Limits from a File tutorial reports a run-time error The sequence file for the Importing Test Limits from a File tutorial reports a run-time error because the pin map uses NI-HSDIO instruments instead of NI-Digital instruments.

Glossary of Terms


  • Bug ID - When an issue is reported to NI, you may be given this ID or find it on ni.com.  You may also find IDs posted by NI on the discussion forums or in KnowledgeBase articles.
  • Legacy ID – An older issue ID that refers to the same issue.  You may instead find this issue ID in older known issues documents.
  • Description - A few sentences which describe the problem. The brief description given does not necessarily describe the problem in full detail.
  • Workaround - Possible ways to work around the problem.
  • Reported Version - The earliest version in which the issue was reported.
  • Resolved Version - Version in which the issue was resolved or was no longer applicable. "N/A" indicates that the issue has not been resolved.
  • Date Added - The date the issue was added to the document (not the reported date).