Use the LabVIEW VI Analyzer Toolkit to improve your maintainability and performance of VIs. You can join the VI Analyzer Enthusiasts group within NI Community to discuss questions and share ideas with other Community members.
The following VI Analyzer configuration is designed specifically for VIs in a typical STS application that uses the NI STS Core Development Software 17.0. Use this file as a starting point to modify for your application.
Download and install the VI Analyzer Toolkit after installing LabVIEW. The VI Analyzer Toolkit is licensed with LabVIEW Professional, but if you do not have LabVIEW Professional, you can purchase the toolkit, or choose to evaluate it.
Note: If you do not see the TestStand Semiconductor Module category, install, repair, or reinstall TestStand Semiconductor Module (TSM).
Performance
Style
Enable all the tests except the following:
Warnings
Enable all the tests except the following:
These tests are designed to reduce or highlight the complexity of your VIs. Disable all tests, except the “Depth of Nesting Structures” test, because TSM VIs are typically large and complex VIs with appropriate structure, making the results of these tests less useful than other tests.
Enable the appropriate tests to enforce more stringent documentation guidelines for your application.
SubVI and User Interface
TSM VIs typically are not used as user interfaces. However, the enabled tests are best practices for all VIs, even ones that are not user interfaces.
File Properties
Icon and Connector Pane
VI Properties
NI recommends that you enable For Loop Error Handling test because it returns a failure for a For Loop that does not implement proper error handling to account for zero iterations.
Enable each of these configurable tests because each one improves the readability and performance of VIs. You can change the values to meet the needs of your application.