Reduce Risk for RF and Microwave Component and Module Test
Passive and active electronically scanned arrays (ESAs) play a critical role in harnessing and defending the electromagnetic spectrum in modern radar and SATCOM applications. Mission success revolves around the characterization and production test of the RF and microwave semiconductor components within these systems. Technological innovations in this area are creating significant design and test challenges, including:
- More efficient high-power RF devices based on modern GaN process technologies
- Increasingly complex RF components and modules with progressively wider bandwidths
- Multichannel RF front ends to handle frequency agile and multiband applications
- More RF channel and high-speed digital I/O integration
- Software defined digital processing capabilities to meet multifunction application needs
Electronically Scanned Array (ESA) Characterization Reference Architecture
- Wide coverage of DC, RF, and digital interface needs for mixed-I/O testing applications
- Scalable configurations for component, module, and sub-assembly test
- Pulsed measurements optimal for radar component validation including pulse to pulse stability and S-parameters
- Unified software for developing, debugging, and deploying test systems and applications
- Additional measurements available with RFmx and InstrumentStudio software
Solution Advantages
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Leverage NI’s modular platform to develop test systems that meet your high-mix, low-volume needs
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Reduce capital cost substantially using high-performance test equipment versus traditional instruments
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Capture better data faster and run multiple test cases simultaneously with NI’s leading measurement speed and quality
“Teams working on the next generations of phased array technology face intense market pressures. Technology advancements create new testing scenarios that must be addressed in less time than previous generations, and traditional approaches have lacked the scalability to meet this challenge while adding risk. The Electronically Scanned Array Characterization Reference Architecture allows teams to validate and test the next generation of phased arrays and their components confidently and in a more scalable fashion than traditional solutions on the market."
–Luke Schreier, SVP & GM, Aerospace, Defense, and Government BU, NI
Build Your Solution with the NI Ecosystem
NIでは、アプリケーション固有の要件に合わせてカスタマイズされた、様々なソリューション統合オプションを提供しています。独自の社内統合チームでシステムを完全制御することも、NI、および世界中のNIパートナーネットワークが持つ専門技術を生かしてターンキーソリューションをご利用いただくことも可能です。
NIパートナーネットワークは、ドメイン、アプリケーション、および全体的なテスト開発エキスパートがNIと緊密に連携してエンジニアリングコミュニティのニーズを満たすグローバルコミュニティです。NIパートナーは、信頼できるソリューションプロバイダ、システムインテグレータ、コンサルタント、製品開発者、幅広い産業やアプリケーション分野に精通したサービスおよび販売チャネルの専門家です。
NI partners with you throughout the life cycle of your application by delivering training, technical support, consultation and integration services, and maintenance programs. Accelerate your learning with our company-specific and geographic user groups. Build proficiency with online and in-person training options.
ESA Characterization Reference Architecture Brochure
Discover how the ESA Characterization Reference Architecture can help you validate and test the latest generation of ESA components, modules, and sub-assemblies for radar, EW, and SATCOM with a modular approach to developing test systems that scales to meet high-mix, low-volume test requirements.
NIパートナーは、日本アライアンスプログラムに参加しているシステムインテグレータを中心としたパートナー企業で、代理店の関係は有していません。