TestStand 2017 Semiconductor Module Known Issues By Date

Overview

This document contains the TestStand Semiconductor Module known issues that were discovered before and since the release of NI TestStand 2017 Semiconductor Module. Not every issue known to NI will appear on this list; it is intended to only show the severe and more common issues that can be encountered.

Each Issue appears as a row in the table and includes these fields:

  • Issue ID - the number at the top of each of the cells in the first column. When you report an issue to NI, you may be given this ID, you can also find IDs posted by NI on the discussion forums or in Knowledge Base articles.
  • Legacy ID (optional) -  If an issue has a legacy ID from NI's legacy/deprecated bug reporting database, you will see it appear on a separate line directly below the Issue ID in the table, or to the right of the Issue ID in the table of contents (separated by a space).
  • Issue Title: in italics - it describes the issue in one sentence or less
  • Problem Description - a few sentences which describe the problem in further detail. The brief description given does not necessarily describe the problem in full detail, and it is expected that you might want more information on an issue. If you would like more information on an issue feel free to contact NI (contact information below) and reference the ID number given in the document.
  • Workaround - possible ways to work around the problem. The workarounds that appear in the document are not always tested by NI and are not guaranteed to resolve the issue. If a workaround refers you to the NI KnowledgeBase, please visit www.ni.com/kb/ and enter that KB number in the search field to locate the specific document.
  • Reported Version - the earliest version of TestStand Semiconductor Module the issue was reported in. If you discover the issue appears in an earlier version of TestStand Semiconductor Module than is reported in this field, you can report that to NI (contact information below) to have the field updated.
  • Resolved Version - version the issue was resolved or was no longer applicable. If an issue has not been resolved "N/A" will be reported.
  • Date Added - the date the issue was added to the document (not necessarily the reported date)

Document Organization:

The following document displays the issues by the date the issue was added to the document (not necessarily the date the issue was reported to NI). This table is recommended for use in helping determine if an issue has been reported to us, and is also recommended for users wanting to skim the document to learn of potential issues they may face with NI TestStand 2017 Semiconductor Module during development.

Contacting NI

Feel free to contact NI regarding this document or issues in the document. If you are contacting NI in regards to a specific issue, be sure to reference the ID number given in the document to the NI representative. The ID number contains the current issue ID number as well as the legacy ID number (use the current ID number when contacting National Instruments). You can contact us through any of the normal support channels including phone, email, or the discussion forums. Visit the NI Website to contact us. Also consider contacting us if you find a workaround for an issue that is not listed in the document so that we can add the workaround to the document.

Known Issues by Date

The following items are known issues in NI TestStand 2017 Semiconductor Module sorted by Date.

563547 In rare cases, certain steps that use the LabVIEW Adapter and default values might report run-time errors when using a test program configuration that loads limits
597659 Using CPU Affinity step might cause some threads to suspend intermittently for several seconds
612228 Launching the Digital Pattern Editor from TSM does not always bring the existing editor to the front
694836 Non-TSM sequence files do not run if TSM is enabled but not licensed
699807 Lot Summary Report Options dialog box does not validate path
701643 TestStand Sequence Analyzer reports errors for comments in expressions
702455 Some TSM examples return TestStand Sequence Analyzer warnings
702568 Unable to load NI-Digital Pattern Driver 17.x assemblies from existing applications, including TSM examples
704375 Non-ASCII characters in load board string properties display as question marks in STDF log
704431 Pin map validation error incorrectly references available sites setting
705441 Errors occur when enabling NI TestStand Semiconductor Module



ID Known Issue
563547

Return
In rare cases, certain steps that use the LabVIEW Adapter and default values might report run-time errors when using a test program configuration that loads limits
Certain rare combinations of default values for array parameters on LabVIEW steps can cause a run-time error when running a test program with a configuration that loads limits from a test limits file.

Workaround: On the step that reports a run-time error, change the step load option to Load Dynamically and the unload option to Unload after the step executes.

Reported Version: 2014    Resolved Version: N/A    Added: 01/01/2016
597659

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Using CPU Affinity step might cause some threads to suspend intermittently for several seconds
When you configure the CPU Affinity step to use fewer cores than are available in processors with eight or more cores, some threads might intermittently suspend.

Workaround: Refer to the National Instruments KnowledgeBase article KnowledgeBase 7G0F28RQ: TestStand Semiconductor Module CPU Optimization on the PXIe-8880 for more information about this issue and available solutions.

Reported Version: 2016    Resolved Version: N/A    Added: 08/05/2016
612228

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Launching the Digital Pattern Editor from TSM does not always bring the existing editor to the front
When an instance of the Digital Pattern Editor is running, attempting to launch the Digital Pattern Editor from TSM does not always bring the existing editor to the front. If the Digital Pattern Editor was originally launched from the Start menu, TSM instead launches a new instance of the Digital Pattern Editor.

Workaround: Manually navigate to an existing instance of the Digital Pattern Editor instead of using the TSM shortcut to bring the existing instance of the editor to the front.

Reported Version: 16.0    Resolved Version: N/A    Added: 10/24/2016
694836

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Non-TSM sequence files do not run if TSM is enabled but not licensed
Sequence files that do not use TSM features cannot run if an unlicensed copy of TSM is installed and enabled on the computer.

Workaround: Disable TSM before you run the sequence file.

Reported Version: 2017    Resolved Version: N/A    Added: 07/27/2018
699807

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Lot Summary Report Options dialog box does not validate path
The Lot Summary Report Options dialog box does not ensure that the path you enter is valid and writable. If you specify an incorrect path, the NI_SemiconductorModule_LotSummaryReportGenerator.seq result processor returns a run-time error.

Workaround: Specify valid path in the dialog.

Reported Version: 2016 SP1    Resolved Version: N/A    Added: 07/27/2018
701643

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TestStand Sequence Analyzer reports errors for comments in expressions
The TSM "Test step properties are not assignable" TestStand Sequence Analyzer rule reports errors in expressions, even if the error is within a comment.

Workaround: Use the #NoValidation function to suppress errors in comments.

Reported Version: 2017    Resolved Version: 2019    Added: 07/27/2018
702455

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Some TSM examples return TestStand Sequence Analyzer warnings
The TestStand Sequence Analyzer reports warnings for some TSM examples. You can ignore the warnings because they do not affect the functionality of the examples.

Workaround: N/A

Reported Version: 2017    Resolved Version: 2019    Added: 07/27/2018
702568

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Unable to load NI-Digital Pattern Driver 17.x assemblies from existing applications, including TSM examples
Any code module written in .NET that uses NI-Digital Pattern Driver 17.x needs to directly target that assembly version. Any .NET code modules written for a previous version of NI-Digital Pattern Driver, such as 16.0, will not load the 17.x version of the NI-Digital Pattern Driver without rebuilding. For example, some of the TSM examples with .NET components target the NI-Digital .NET 16.0 driver. You cannot run those examples without changing the .csproj reference to a newer version of the NI-Digital Pattern Driver and recompiling the code.

Workaround: Upgrade to NI-Digital Pattern Driver 18.0.

Reported Version: 2016 SP1    Resolved Version: N/A    Added: 07/27/2018
704375

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Non-ASCII characters in load board string properties display as question marks in STDF log
If load board string properties contain non-ASCII characters, the STDF log displays those characters as question marks. STDF supports only ASCII characters.

Workaround: Use only ASCII characters in load board string properties.

Reported Version: 2017    Resolved Version: 2019    Added: 07/27/2018
704431

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Pin map validation error incorrectly references available sites setting
A pin map validation run-time error message incorrectly states that you can change the number of available sites in the Configure Station Settings dialog box. The correct setting to change is the Enabled Sites option in the Configure Lot Settings dialog box.

Workaround: N/A

Reported Version: 2017    Resolved Version: 2019    Added: 07/27/2018
705441

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Errors occur when enabling NI TestStand Semiconductor Module
When you enable TSM, an error might occur and return the message "Error occurred enabling Semiconductor Module: Object reference not set to an instance of an object." A second error also might occur that states "Object reference not set to an instance of an object." These errors do not affect functionality. Close the error windows to use TSM normally.

Workaround: N/A

Reported Version: 2017    Resolved Version: 2019    Added: 07/27/2018

Glossary of Terms

 

  • Bug ID - When an issue is reported to NI, you may be given this ID or find it on ni.com.  You may also find IDs posted by NI on the discussion forums or in KnowledgeBase articles.
  • Legacy ID – An older issue ID that refers to the same issue.  You may instead find this issue ID in older known issues documents.
  • Description - A few sentences which describe the problem. The brief description given does not necessarily describe the problem in full detail.
  • Workaround - Possible ways to work around the problem.
  • Reported Version - The earliest version in which the issue was reported.
  • Resolved Version - Version in which the issue was resolved or was no longer applicable. "N/A" indicates that the issue has not been resolved.
  • Date Added - The date the issue was added to the document (not the reported date).